On the De-Embedding Issue of Millimeter-Wave and Sub-Millimeter-Wave Measurement and Circuit Design

On the De-Embedding Issue of Millimeter-Wave and Sub-Millimeter-Wave Measurement and Circuit Design
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毫米波和亚毫米波测量与电路设计的去嵌入问题

DOI:
10.1109/tcpmt.2012.2200482
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发表时间:
2012-06
影响因子:
2.2
通讯作者:
Li, Joshua Le-Wei
Li, Joshua Le-Wei
中科院分区:
工程技术3区
文献类型:
--
作者:
Xiong, Yong-Zhong;Wang, Lei;Hu, Sanming;Li, Joshua Le-Wei

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本文的目的是通过广泛比较几种常用的方法,并提出一种新的基于全矩阵计算的去嵌入方法,解决毫米波(mmWave)和亚毫米波测量和电路设计的去嵌入问题。比较的目的是研究不同的去嵌入方法对毫米波和亚毫米波电路设计的影响。为了在毫米波和亚毫米波范围内获得更精确的结果,提出了一种新的去嵌入方法。该方法通过矩阵计算从被测器件中减去所有可能的外部因素,以消除等效电路的误差。研究了寄生元件对fT和fMAX的影响。在170 GHz频率下,对不同的去嵌入方法进行了比较,结果表明,该方法在甚高频下也具有良好的去嵌入精度,适用于毫米波和亚毫米波测量和电路设计。
The purpose of this paper is to address the de-embedding issue of millimeter-wave (mmWave) and sub-mmWave measurements and circuit design by extensively comparing several commonly used methods and by proposing a new full-matrix calculation-based de-embedding methodology. The comparison aims to investigate the impacts of different de-embedding methods on mmWave and sub-mmWave circuit design. A new de-embedding method has been proposed to achieve more accurate results on mmWave and sub-mmWave range. In this method, all possible extrinsic elements are subtracted from the measured device under test data by matrix calculation to eliminate the error from equivalent circuit. The influence of parasitic elements on the fT and fMAX are investigated. The comparison of the different de-embedding methods for transistors are performed up to 170 GHz, the results showed that the proposed method has good accuracy even at very high-frequency and it is suitable for mmWave and sub-mmWave measurements and circuit design.
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