On the De-Embedding Issue of Millimeter-Wave and Sub-Millimeter-Wave Measurement and Circuit Design
On the De-Embedding Issue of Millimeter-Wave and Sub-Millimeter-Wave Measurement and Circuit Design
复制标题
毫米波和亚毫米波测量与电路设计的去嵌入问题
DOI:
10.1109/tcpmt.2012.2200482
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发表时间:
2012-06
影响因子:
2.2
通讯作者:
Li, Joshua Le-Wei
中科院分区:
文献类型:
--
作者:
Xiong, Yong-Zhong;Wang, Lei;Hu, Sanming;Li, Joshua Le-Wei
The purpose of this paper is to address the de-embedding issue of millimeter-wave (mmWave) and sub-mmWave measurements and circuit design by extensively comparing several commonly used methods and by proposing a new full-matrix calculation-based de-embedding methodology. The comparison aims to investigate the impacts of different de-embedding methods on mmWave and sub-mmWave circuit design. A new de-embedding method has been proposed to achieve more accurate results on mmWave and sub-mmWave range. In this method, all possible extrinsic elements are subtracted from the measured device under test data by matrix calculation to eliminate the error from equivalent circuit. The influence of parasitic elements on the fT and fMAX are investigated. The comparison of the different de-embedding methods for transistors are performed up to 170 GHz, the results showed that the proposed method has good accuracy even at very high-frequency and it is suitable for mmWave and sub-mmWave measurements and circuit design.
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影响因子:
3.1
作者:
Wen Wu;S. Lam;Mansun Chan
通讯作者:
Wen Wu;S. Lam;Mansun Chan
DOI:
10.1109/tmtt.2007.904041
发表时间:
2007-09
影响因子:
4.3
作者:
A. Issaoun;Yong Zhong Xiong;Jinglin Shi;J. Brinkhoff;F. Lin
通讯作者:
A. Issaoun;Yong Zhong Xiong;Jinglin Shi;J. Brinkhoff;F. Lin
DOI:
10.1109/rfic.2008.4561424
发表时间:
2008-07
期刊:
2008 IEEE Radio Frequency Integrated Circuits Symposium
影响因子:
--
作者:
S. Nicolson;A. Tomkins;K. W. Tang;A. Cathelin;D. Belot;S. Voinigescu
通讯作者:
S. Nicolson;A. Tomkins;K. W. Tang;A. Cathelin;D. Belot;S. Voinigescu
影响因子:
4.3
作者:
Chih-Hung Chen;M. Deen
通讯作者:
Chih-Hung Chen;M. Deen
DOI:
10.1109/tmtt.2009.2017359
发表时间:
2009-04
影响因子:
4.3
作者:
N. Waldhoff;C. Andrei;D. Gloria;S. Lépilliet;F. Danneville;G. Dambrine
通讯作者:
N. Waldhoff;C. Andrei;D. Gloria;S. Lépilliet;F. Danneville;G. Dambrine