The characteristic shape of emission profiles of plasma spokes in HiPIMS: the role of secondary electrons

The characteristic shape of emission profiles of plasma spokes in HiPIMS: the role of secondary electrons
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HiPIMS 中等离子体辐条发射轮廓的特征形状:二次电子的作用

DOI:
10.1088/0022-3727/47/10/102003
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发表时间:
2014
期刊:
Journal of Physics D: Applied Physics
影响因子:
--
通讯作者:
Winter J
Winter J
中科院分区:
--
文献类型:
--
作者:
Hecimovic A;Böke M;Winter J

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高功率脉冲磁控溅射(HiPIMS)等离子体发射的时间分辨分析揭示了旋转辐条形式的不均匀性。这些辐条的形状非常具有特征性,取决于目标材料。局域增强的光发射与离子产生有关。基于这些数据,发射曲线的奇特形状可以通过二次电子的局部产生来解释,从而导致增强的向外扩散。这一总体图像能够解释所观察到的发射轮廓为不同的目标材料,包括气体稀薄和溅射元素的第二电离电位。
A time-resolved analysis of the emission of high power impulse magnetron sputtering (HiPIMS) plasmas reveals inhomogeneities in the form of rotating spokes. The shape of these spokes is very characteristic depending on the target material. The localized enhanced light emission has been correlated with the ion production. Based on these data, the peculiar shape of the emission profiles can be explained by the localized generation of secondary electrons, resulting in an enhanced outward diffusion. This general picture is able to explain the observed emission profile for different target materials including gas rarefaction and second ionization potential of the sputtered elements.
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