Analog Placement Constraint Extraction and Exploration with the Application to Layout Retargeting
Analog Placement Constraint Extraction and Exploration with the Application to Layout Retargeting
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模拟布局约束提取和探索及其在布局重定向中的应用
DOI:
10.1145/3177540.3178245
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发表时间:
2018
期刊:
影响因子:
--
通讯作者:
Pan, David Z.
中科院分区:
文献类型:
--
作者:
Xu, Biying;Basaran, Bulent;Su, Ming;Pan, David Z.
In analog/mixed-signal (AMS) integrated circuits (ICs), most of the layout design efforts are still handled manually, which is time-consuming and error-prone. Given the previous high-quality manual layouts containing valuable design expertise of experienced designers, exploring layout design constraints from the existing layouts is desirable. In this paper, we extract and explore analog placement constraints from previous quality-approved layouts, including regularity and symmetry (symmetry-island) constraints. For the first time, an efficient sweep line-based algorithm is developed to comprehensively extract the regularity constraints in a given analog placement, which can not only improve routability but also minimize the layout parasitics-induced circuit performance degradation. Furthermore, we propose a novel layout technology migration and performance retargeting framework, where we apply the constraint extraction algorithms to improve the placement quality while preserving previous design expertise. Experimental results show that the proposed techniques can preserve the symmetry and regularity constraints, and also reduce the placement area by 7.6% on average.
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DOI:
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发表时间:
2010
期刊:
Asia and South Pacific Design Automation Conference
影响因子:
--
作者:
Zheng Liu;Lihong Zhang
通讯作者:
Lihong Zhang
DOI:
10.1145/2744769.2744865
发表时间:
2015-06
期刊:
2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC)
影响因子:
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作者:
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H. Ou;Kai-Han Tseng;Jhao-Yan Liu;I-Peng Wu;Yao-Wen Chang
DOI:
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发表时间:
2008
期刊:
2008 45th ACM/IEEE Design Automation Conference
影响因子:
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作者:
Mark Po;Shyh
通讯作者:
Shyh
DOI:
10.1109/4.391116
发表时间:
1995-07
期刊:
IEEE J. Solid State Circuits
影响因子:
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作者:
K. Lampaert;G. Gielen;W. Sansen
通讯作者:
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DOI:
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发表时间:
1997
期刊:
ACM International Symposium on Physical Design
影响因子:
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作者:
Fook;Zhan Chen;G. Téllez
通讯作者:
G. Téllez