Self-cleaning mechanisms in ultrasonic bonding of Al wire
Self-cleaning mechanisms in ultrasonic bonding of Al wire
复制标题
铝线超声键合中的自清洁机制
DOI:
10.1016/j.jmatprotec.2018.03.016
复制
发表时间:
2018
影响因子:
6.3
通讯作者:
Twiefel
中科院分区:
文献类型:
--
作者:
Dencker;Hermsdorf;Twiefel
Real-time observations of the artificially increased oxide layer during the ultrasonic (US) bonding process were carried out to reveal the self-cleaning mechanisms. After the normal force loading, cracks occurred in the Al2O3layer at the peripheral region of the wire/substrate interface and were perpendicular to the wire direction. As the US vibration started, the oxides started to detach from the pure metal surface and moved towards the middle of the contact area. With further vibration cycles, these detached oxides were milled from flakes into small particles. Due to three mechanisms including penetration, oxide flow and pushing, the small oxide particles were transported to the peripheral contact region or the outside of the contact area. When a metal splash existed, the flowing out of large amounts of oxides was facilitated. Pre-deformation originates cracks; vibration plays a significant role in detachment, milling, penetration and oxide flow; while the plastic deformation induced material flow is more critical on removing the oxides from the substrate by pushing. The shear tests showed that a 50 nm oxide coating could significantly enhance the Al-glass bonding strength by 2∼3 times.
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DOI:
--
发表时间:
2017
期刊:
CPMT Symposium Japan
影响因子:
--
作者:
Y. Long;F. Dencker;Andreas Isaak;Chun Li;M. Wurz;J. Twiefel;J. Wallaschek;F. Schneider;J. Hermsdorf
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发表时间:
2018
期刊:
Materials Science and Engineering: B
影响因子:
--
作者:
Dencker;Schneider;Hermsdorf;Twiefel;Wallaschek
通讯作者:
Wallaschek
DOI:
10.1109/eptc.2016.7861512
发表时间:
2016
期刊:
2016 IEEE 18th Electronics Packaging Technology Conference (EPTC)
影响因子:
--
作者:
Y. Long;F. Dencker;F. Schneider;B. Emde;Chun Li;J. Hermsdorf;M. Wurz;J. Twiefel
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J. Twiefel
DOI:
10.4071/isom-2016-tha31
发表时间:
2016
期刊:
2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC)
影响因子:
--
作者:
Y. Long;F. Dencker;M. Wurz;A. Feldhoff;J. Twiefel
通讯作者:
J. Twiefel