Instrumentation for Integrated Circuit Design Laboratory

集成电路设计实验室仪器仪表

• 批准号: 8853052
• 负责人: Peter Aronhime
• 金额: $ 2.14万
• 依托单位: University of Louisville
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1988
• 资助国家: 美国
• 起止时间: 1988-11-15 至 1991-10-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=8853052&HistoricalAwards=false
• 关键词: Instrumentation; Integrated; Circuit; Design; Laboratory

This proposal requests two Hewlett Packard 4145B semiconductor parameter analyzers and two plotters provide the base for laboratory improvement in the area of integrated circuit design. The purposes of the laboratory improvement are to introduce modern measurement approaches to integrated device and circuit characterization and to improve the laboratory offerings associated with two recently introduced courses in the integrated circuit design area. One course emphasizes analog integrated circuit design, and the other emphasizes VLSI subsystems design and includes their fabrication. These courses were placed together to provide cross-fertilization between digital and analog design as well as between MOS and bipolar technologies. The equipment will be used to measure and plot semiconductor device parameters and the characteristics of basic circuits such as integrated resistors, amplifiers, sources, level shifters, logic gates, and nonlinear analog functional circuits. Input/output and transfer characteristics will be measured for devices and circuits.

该提案要求两台Hewlett Packard 4145B半导体参数分析仪和两台绘图仪为集成电路设计领域的实验室改进提供基础。 实验室改进的目的是引入现代测量方法来进行集成器件和电路表征，并改进与集成电路设计领域最近推出的两门课程相关的实验室产品。 一门课程强调模拟集成电路设计，另一门课程强调 VLSI 子系统设计及其制造。 这些课程放在一起，旨在提供数字和模拟设计以及 MOS 和双极技术之间的交叉融合。 该设备将用于测量和绘制半导体器件参数以及集成电阻器、放大器、源、电平转换器、逻辑门和非线性模拟功能电路等基本电路的特性。 将测量设备和电路的输入/输出和传输特性。