Scanning Probe Microscopy for Materials Research

扫描探针显微镜用于材料研究的三个一般领域的研究：(1)对探针-表面相互作用的基础研究，以增强对成像中对比机制的理解；(2)在材料研究中的试验应用，特别强调成像电流传输路径；(3)开发用于软材料的更温和的原子力显微镜，开发液氮温度显微镜；开发了可同时成像表面形貌和表面电导率的导电尖端原子力显微镜。

Investigations in three general areas in which scanning probe microscopy is employed for materials research: (i) fundamental studies of probe-surface interactions to enhance understanding of contrast mechanisms in imaging, (ii) trial applications in materials research, with special emphasis on imaging current transport paths, and (iii) development of gentler atomic force microscopes for soft materials, development of liquid nitrogen temperature microscopes, and development of atomic force microscopes with conducting tips for simultaneous imaging of surface topography and surface conductivity.