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Scanning Probe Microscopy for Materials Research

Scanning Probe Microscopy for Materials Research
用于材料研究的扫描探针显微镜
批准号:
9622169
负责人:
Paul Hansma
金额:
$70.0万
依托单位国家:
美国
项目类别:
Continuing Grant
财政年份:
1996
资助国家:
美国
项目状态:
已结题
起止时间:
1996-07-15 至 2001-03-31

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中文摘要
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英文摘要
w:\awards\awards96\num.doc 9622169 Hansma This project will advance the state-of-the-art in Atomic Force Microscopy, AFM, for materials research. Specifically, work is proposed to design and fabricate new cantilevers down to the size range of 2 microns wide and 4 microns long together with the new AFMs that will be required to use them. These new cantilevers will make it possible to achieve resonant frequencies of over a mega-Hertz for cantilevers gentle enough to use on a wide range of materials including soft biomaterials. This will require spring constants of order 0.1 N/m, which can be achieved with metallic cantilevers of order 50 nm thick. These new cantilevers and AFMs will be used for imaging the motion of individual protein molecules during the process of biochemical reaction leading biomaterial products such as RNA. %%% This project will advance the state-of-the-art in Atomic Force Microscopy, AFM. Specifically, work is proposed to build the next generation of AFMs and to demonstrate their advantages for materials research. The United States currently leads the world in the production of commercial AFMs. This success is based, in part, on previous NSF support, which lead to prototypes that are the basis of that current generation of AFMs. The next generation of AFMs will use cantilevers that are less than one-tenth the size used currently. This grant will fund work on the development of both these cantilevers and the new AFMs to use them. These new AFMs will be faster, gentler and have higher resolution than current AFMs. ***
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Scanning Probe Microscopy for Materials Research
Scanning Probe Microscopy for Materials Research
Development of Scanning Probe Microscope Integrated with Scanning Electron Microscope for Probe Fabrication
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