Research in High-Speed, High-Resolution Analog-Digital Conversion

随着大规模集成电路和超大规模集成电路数字技术的快速发展，数字技术在信号处理和控制方面的应用比过去广泛得多。随着这类系统集成化水平的不断提高，在VLSI控制或信号处理器件本身实现模拟/数字（A/D）转换功能变得越来越迫切。在过去的十年中，各种类型的MOS LSI技术在实现模拟功能方面取得了很大的进展，最初使用NMOS，然后使用CMOS，随着该技术的成熟，以及最近的BiCMOS技术。本研究针对单片A/D转换的新架构和新方法，更接近用于实现它们的技术所施加的基本限制。重点主题包括高速，高分辨率流水线A/D转换器的自校准技术，并行流水线或“收缩”A/D转换器的特性，使用电荷传输信号处理的微功率高速A/D转换器，最佳解码算法和过采样A/D转换器的稳定性和缩放，超高速过采样A/D转换器的方法，以及用于传感器应用中读出目的的机电sigma-delta A/D转换器的性能限制。

Gray The rapid evolution of LSI and VLSI digital technologies has resulted in much wider utilization of digital techniques for signal processing and control applications than in the past. As the level of integration of such systems continues to increase, it has become more and more desirable to implement the Analog/Digital (A/D) conversion function on the VLSI control or signal processing device itself. Great progress has been made in the past ten years in the implementation of analog functions of various types of MOS LSI technology, using NMOS initially, then CMOS as that technology matured, and most recently BiCMOS technology. This research is directed towards new architectures and new approaches to monolithic A/D conversion which more closely approach the fundamental limits imposed by the technology used to implement them. Topics of emphasis include self-calibration techniques for high-speed, high resolution pipeline A/D converters, properties of parallel pipeline, or "systolic" A/D converters, micropower high speed A/D converters using charge transfer signal processing, optimum decoding algorithms and stability and scaling in oversampled A/D converters, approaches to very high speed oversampled A/D converters, and performance limits for the electromechanical sigma-delta A/D converter used for readout purposes in sensor applications.