Research in High-Speed, High-Resolution Analog-Digital Conversion

灰色 大规模集成电路和超大规模集成电路数字技术的迅速发展，使数字技术在信号处理和控制应用中的应用比过去广泛得多。 随着这种系统的集成度不断提高，越来越希望在VLSI控制或信号处理设备本身上实现模/数（A/D）转换功能。 在过去的十年中，在实现各种类型的MOS LSI技术的模拟功能方面取得了很大的进展，最初使用NMOS，然后随着该技术的成熟使用CMOS，最近使用BiCMOS技术。 这项研究是针对新的架构和新的方法，单片A/D转换，更接近的基本限制所施加的技术来实现它们。 重点包括高速、高分辨率流水线A/D转换器的自校准技术、并行流水线或“脉动”A/D转换器的特性、采用电荷转移信号处理的微功耗高速A/D转换器、过采样A/D转换器的最佳解码算法和稳定性及缩放、超高速过采样A/D转换器的实现方法、以及传感器应用中用于读出目的的机电Σ-Δ A/D转换器的性能限制。

Gray The rapid evolution of LSI and VLSI digital technologies has resulted in much wider utilization of digital techniques for signal processing and control applications than in the past. As the level of integration of such systems continues to increase, it has become more and more desirable to implement the Analog/Digital (A/D) conversion function on the VLSI control or signal processing device itself. Great progress has been made in the past ten years in the implementation of analog functions of various types of MOS LSI technology, using NMOS initially, then CMOS as that technology matured, and most recently BiCMOS technology. This research is directed towards new architectures and new approaches to monolithic A/D conversion which more closely approach the fundamental limits imposed by the technology used to implement them. Topics of emphasis include self-calibration techniques for high-speed, high resolution pipeline A/D converters, properties of parallel pipeline, or "systolic" A/D converters, micropower high speed A/D converters using charge transfer signal processing, optimum decoding algorithms and stability and scaling in oversampled A/D converters, approaches to very high speed oversampled A/D converters, and performance limits for the electromechanical sigma-delta A/D converter used for readout purposes in sensor applications.