Conference: Organization of the 1992 Surface Roughness and Scattering Topical Meeting to be held in Tucson, Arizona on June 1-3, 1992.

这笔拨款是为1992年6月1日至3日在亚利桑那州图森举行的1992年表面粗糙度和散射专题会议提供部分支持。这是第一次由美国光学学会主办的此类会议；它的目的是汇集不同群体的研究人员，包括实验学家和理论家，讨论他们在表面粗糙度和散射领域的工作。会议将与干涉涂层专题会议同时举行，并将包括讨论光学涂层的粗糙度和散射的联合会议。将讨论新的制造技术，例如实现超光滑表面光洁度和精确磨削以实现最终形状和光洁度的方法；这是在真空紫外和x射线光谱区域使用镜子的关键要求。将讨论测量形状、表面光洁度、化学成分和其他性能所需的表征技术。重点将放在专门测量的新仪器设计的发展上。这将为仪器设计人员、制造商和用户之间的互动提供机会。我们将要讨论的一个例子是原子力显微镜及其在表面上的应用。此外，还将举行专门讨论小组，讨论半导体、光学、汽车等商业行业对表面统计分析的要求。依赖于高质量的表面处理。

This grant is for partial support of the 1992 Surface Roughness and Scattering Topical Meeting, Tucson, AZ, June 1-3, 1992. This is the first such meeting to be sponsored by the Optical Society of America; its purpose is to bring together a diverse group of researchers, both experimentalists and theorists, to discuss their work in the area of surface roughness and scattering. The meeting will be held concurrently with the Topical Conference on Interference Coatings, and will include a joint session to discuss roughness and scattering in optical coatings. New fabrication techniques will be discussed, such as methods for achieving supersmooth surface finish and precision grinding to achieve final shape and finish, which are critical requirements for mirrors uses in the vacuum ultraviolet and x-ray spectral regions. Characterization techniques needed to measure shape, surface finish characteristics, chemical composition and other properties will be discussed, where emphasis will be on development of new instrument designs for specialized measurements. This will provide opportunities for interactions between instrument designers, manufacturers and users. One such example that will be discussed is the atomic force microscope and its application to surfaces. A specialized panel will be held to discuss requirements for statistical analysis of surfaces for various industries needs such as in semiconductor, optical and other commercial industries, including automobiles, that rely on high quality surface finishes.