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Characterization of Novel Rare Earth Phosphide Compounds Lattice-matched to InP.

与 InP 晶格匹配的新型稀土磷化物化合物的表征。

基本信息

批准号：
9312173
负责人：
Jennifer Hwu-Sadwick
金额：
$ 6万
依托单位：
University of Utah
依托单位国家：
美国
项目类别：
Standard Grant
财政年份：
1993
资助国家：
美国
起止时间：
1993-08-15 至 1995-07-31
项目状态：
已结题

来源：
https://www.nsf.gov/awardsearch/showAward?AWD_ID=9312173&HistoricalAwards=false
关键词：
Characterization Novel Rare Earth Phosphide

项目摘要

9312173 Hwu-Sadwick An investigation of some of the most promising thermodynamically stable, chemically inert, elemental metal-phosphide binary compound heteroepitaxial candidates to indium phosphide (InP) is proposed. Electrical and Optical characterizations at both room temperature and after elevated temperature annealing will be carried out and theoretical studies will be conducted to develop the understanding of the material and device properties of these new heteroepitaxial barriers to InP binary and ternary compound material. Optical measurements such as photoluminenscence (PL), photoreflectance (PR), Raman, absorption and transmission and electrical measurements such as capacitance versus voltage (CV), current versus voltage (I-V), photoresponse, and resistivity measurements for the Schottky contacts and transmission line and resistivity measurements for the Ohmic contacts will be performed to determine the material and device characteristics of these new material systems. The RE-P heteroepitaxial layers will also be grown on semi-insulating InP substrates so that Hall effect, magnetoresistance, and resistivity versus temperature measurements can be performed in an effort to ascertain whether the RE-P epilayers are metals, semimetals, semiconductors, or insulators. Simulation models will be developed to perform energy band structure and bandgap calculations of these new material systems. In addition, novel ternary compounds such as RExIn1-xP will be theoretically studied. ***

[9312173] huu - sadwick提出了一些最有前途的热稳定性、化学惰性、单质金属-磷化物二元化合物磷化铟（InP）异质外延候选材料的研究。在室温和高温退火后进行电学和光学表征，并进行理论研究，以加深对这些新型InP二元和三元化合物异质外延势垒材料和器件特性的理解。光学测量，如光致发光（PL），光反射率（PR），拉曼，吸收和传输和电气测量，如电容对电压（CV），电流对电压（I-V），光响应，肖特基触点和传输线的电阻率测量和欧姆触点的电阻率测量将被执行，以确定这些新材料系统的材料和器件特性。RE-P异质外延层也将生长在半绝缘的InP衬底上，以便进行霍尔效应、磁电阻和电阻率随温度的测量，以确定RE-P外延层是金属、半金属、半导体还是绝缘体。将开发模拟模型来执行这些新材料系统的能带结构和带隙计算。此外，还将对RExIn1-xP等新型三元化合物进行理论研究。＊＊＊