Development of Planar Microwave Devices for Microwave Resonance Measurements of Sub-Micron Samples

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9317338 Vittoria Technical abstract: Standard lithographic techniques will be used to construct a planar microwave device which will be capable of measuring microwave resonance signals over a probe area of 0.1 x 0.1 micron2 of a magnetic thin film. Current operational devices probe areas of 100 x 100 micron2. Measurements of the microwave resonance spectra as a function of probe size will be performed on standard metal films. It is expected that these devices will be useful for the study of magnetic thin films and multilayers, fine powders, and single magnetic domains. Non-technical abstract: Many interesting magnetic phenomena occur on a very small (less than 1/1000 of a millimeter) scale. These are often related to structurally small objects such as fine powders but also include microscopic magnetic phenomena. Standard magnetic characterization techniques can determine only an average property. It is proposed to build and test a device which will be capable of performing magnetic measurements on a scale of 1/1000mm. The device will be useful for studying a variety of thin films as well as magnetic powders. ***