NSF Young Investigator: A New Search Strategy for Design Automation

NSF 青年研究员：设计自动化的新搜索策略

• 批准号: 9357581
• 负责人: Irith Pomeranz
• 金额: $ 31.25万
• 依托单位: University of Iowa
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 1993
• 资助国家: 美国
• 起止时间: 1993-09-01 至 2000-02-29
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9357581&HistoricalAwards=false
• 关键词: NSF; Young; Investigator; New; Search

Pomeranz A method for solving CAD design and test problems, which is especially suitable for solving large problems because it does not deteriorate as circuit size is increased, is being explored. The approach is to scale down the problem while retaining all of its details; find high quality solutions for a sequence of small circuits; develop rules for solving these problems; and then scale up these miniature solutions into a solution for the large problem. Since the miniature solutions are optimal, the full- sized solutions are expected to have very high quality. Research problems being explored are: 1. test generation for various fault models on designs given at the gate and higher levels; 2. built-in-self-test methods; and 3. testing of synchronous sequential circuits that require two pattern tests.

彭慕兰 正在探索一种解决CAD设计和测试问题的方法，该方法特别适合于解决大型问题，因为它不会随着电路尺寸的增加而恶化。 方法是缩小问题，同时保留所有细节;为一系列小电路找到高质量的解决方案;开发解决这些问题的规则;然后将这些微型解决方案扩展为大问题的解决方案。 由于微型解决方案是最佳的，全尺寸的解决方案预计将有非常高的质量。 研究探讨的问题有：1. 在门级和更高级别上给出的设计上的各种故障模型的测试生成; 2. 内建自测试方法;以及3. 同步时序电路的测试需要两个模式测试。