NSF Young Investigator: A New Search Strategy for Design Automation

一种解决CAD设计和测试问题的方法正在探索中，这种方法特别适合解决大型问题，因为它不会随着电路尺寸的增加而恶化。方法是在保留所有细节的同时缩小问题的规模；为一系列小电路找到高质量的解决方案；制定解决这些问题的规则；然后把这些小的解决方案放大成一个大问题的解决方案。由于微型解决方案是最佳的，全尺寸解决方案有望有非常高的质量。正在探索的研究问题有：1。在门级及更高层次上给出各种故障模型的测试生成；2. built-in-self-test方法;和3。需要两次模式测试的同步顺序电路的测试。

Pomeranz A method for solving CAD design and test problems, which is especially suitable for solving large problems because it does not deteriorate as circuit size is increased, is being explored. The approach is to scale down the problem while retaining all of its details; find high quality solutions for a sequence of small circuits; develop rules for solving these problems; and then scale up these miniature solutions into a solution for the large problem. Since the miniature solutions are optimal, the full- sized solutions are expected to have very high quality. Research problems being explored are: 1. test generation for various fault models on designs given at the gate and higher levels; 2. built-in-self-test methods; and 3. testing of synchronous sequential circuits that require two pattern tests.