High-Quality Tests for Synchronous Sequential Circuits

同步时序电路的高质量测试

• 批准号: 9725053
• 负责人: Irith Pomeranz
• 金额: $ 31.8万
• 依托单位: University of Iowa
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1998
• 资助国家: 美国
• 起止时间: 1998-02-01 至 2000-10-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9725053&HistoricalAwards=false
• 关键词: Quality; Tests; Synchronous; Sequential; Circuits

The goal of this project is to develop test procedures for synchronous sequential circuits to produce high quality solutions taking into account the size and complexity of modern circuits. Quality is measured by the fault coverage, the defect coverage, and the test sequence length. To handle size and complexity, high quality solutions are being derived using limited run time and memory. New heuristics and techniques for test generation, test compaction and design-for-testability to address this need are being explored.

该项目的目标是开发同步时序电路的测试程序，以产生高质量的解决方案，同时考虑到现代电路的规模和复杂性。质量是通过故障覆盖率、缺陷覆盖率和测试序列长度来衡量的。为了处理规模和复杂性，正在使用有限的运行时间和内存来获得高质量的解决方案。正在探索用于测试生成、测试压缩和可测试性设计的新的算法和技术，以满足这一需求。