High-Quality Tests for Synchronous Sequential Circuits

该项目的目标是开发同步时序电路的测试程序，以产生高质量的解决方案，同时考虑到现代电路的规模和复杂性。质量通过故障覆盖率、缺陷覆盖率和测试序列长度来衡量。为了处理规模和复杂性，正在使用有限的运行时间和内存来获得高质量的解决方案。正在探索用于测试生成、测试压缩和可测试性设计的新的算法和技术，以满足这一需求。

The goal of this project is to develop test procedures for synchronous sequential circuits to produce high quality solutions taking into account the size and complexity of modern circuits. Quality is measured by the fault coverage, the defect coverage, and the test sequence length. To handle size and complexity, high quality solutions are being derived using limited run time and memory. New heuristics and techniques for test generation, test compaction and design-for-testability to address this need are being explored.