SHF: Small: A Mosaic-Like Approach to the Selection of Fault Models

电子芯片在其制造和使用寿命期间容易受到缺陷的影响。随着技术的进步，由于更复杂的制造工艺和更小的特征尺寸，对缺陷的易感性增加了。检测缺陷的发生对于电子芯片的正确操作以及包含它们的许多产品的正确和安全操作至关重要。这个项目将为学生们在当前和未来技术中设计和制造可靠的电子芯片的挑战做好准备。该项目的负责人是普渡大学的一名女教员，她将为女性和弱势群体树立榜样，鼓励她们攻读电气和计算机工程领域的学位，从而为未来劳动力中急需的多样性做出贡献。为了管理缺陷行为的复杂性和可变性，使用故障模型作为缺陷的抽象表示，并针对从不同模型中检测故障进行了一套全面的测试。但是，来自不同型号的故障可能有类似的测试，当不存在测试时，芯片某些区域的缺陷仍然未被发现。为了解决在整个电子芯片中检测缺陷的需要，在本项目中，将故障视为马赛克中的碎片，目标是确保马赛克完整。当马赛克的每个区域都被足够数量的碎片覆盖时，就达到了完整性。就故障而言，可以实现完整性，例如，通过定义一个新的故障模型来补充现有的故障模型，从而使测试独立于两个模型的故障而存在。基于马赛克的方法将作为行业启发框架的一部分来实现，该框架产生关于可能发生的缺陷的信息，并使用商业工具。

Electronic chips are susceptible to defects that occur during their manufacturing as well as their lifetime. As technologies advance, the susceptibility to defects increases because of more complex manufacturing processes and smaller feature sizes. Detecting the occurrence of defects is critical to the correct operation of electronic chips, and the correct and safe operation of the many products that include them. This project will prepare students for the challenges of designing and manufacturing reliable electronic chips in current and future technologies. The PI of this project is a female faculty member at the Purdue university, and will play role model for women and underrepresented groups to encourage them for pursuing degrees in the field of electrical and computer engineering, thus contributing to the much needed diversity in the future workforce.To manage the complexity and variability in defect behaviors, fault models are used as abstract representations of defects, and a comprehensive set of tests targets the detection of faults from different models. However, faults from different models may have similar tests, and when tests do not exist, defects in certain areas of the chip remain uncovered. To address the need to detect defects in the entire electronic chip, in this project, the faults are considered as pieces in a mosaic, and the goal is to ensure that the mosaic is complete. Completeness is achieved when every area of the mosaic is covered by a sufficient number of pieces. In terms of faults, completeness is achieved, for example, by defining a new fault model to complement an existing one such that tests exist independently for faults from the two models. The mosaic-based approach will be implemented as part of an industry-inspired framework that produces information about likely-to-occur defects, and using commercial tools.