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SHF: Small: A Mosaic-Like Approach to the Selection of Fault Models

SHF：小：一种选择故障模型的马赛克式方法

基本信息

批准号：
1714147
负责人：
Irith Pomeranz
金额：
$ 29.4万
依托单位：
Purdue University
依托单位国家：
美国
项目类别：
Standard Grant
财政年份：
2017
资助国家：
美国
起止时间：
2017-09-01 至 2021-08-31
项目状态：
已结题

来源：
https://www.nsf.gov/awardsearch/showAward?AWD_ID=1714147&HistoricalAwards=false
关键词：
SHF Small Mosaic Like Approach

项目摘要

Electronic chips are susceptible to defects that occur during their manufacturing as well as their lifetime. As technologies advance, the susceptibility to defects increases because of more complex manufacturing processes and smaller feature sizes. Detecting the occurrence of defects is critical to the correct operation of electronic chips, and the correct and safe operation of the many products that include them. This project will prepare students for the challenges of designing and manufacturing reliable electronic chips in current and future technologies. The PI of this project is a female faculty member at the Purdue university, and will play role model for women and underrepresented groups to encourage them for pursuing degrees in the field of electrical and computer engineering, thus contributing to the much needed diversity in the future workforce.To manage the complexity and variability in defect behaviors, fault models are used as abstract representations of defects, and a comprehensive set of tests targets the detection of faults from different models. However, faults from different models may have similar tests, and when tests do not exist, defects in certain areas of the chip remain uncovered. To address the need to detect defects in the entire electronic chip, in this project, the faults are considered as pieces in a mosaic, and the goal is to ensure that the mosaic is complete. Completeness is achieved when every area of the mosaic is covered by a sufficient number of pieces. In terms of faults, completeness is achieved, for example, by defining a new fault model to complement an existing one such that tests exist independently for faults from the two models. The mosaic-based approach will be implemented as part of an industry-inspired framework that produces information about likely-to-occur defects, and using commercial tools.

电子芯片容易受到在其制造期间以及其寿命期间发生的缺陷的影响。随着技术的进步，由于更复杂的制造工艺和更小的特征尺寸，对缺陷的敏感性增加。检测缺陷的发生对于电子芯片的正确操作以及包括它们的许多产品的正确和安全操作至关重要。该项目将为学生准备在当前和未来技术中设计和制造可靠的电子芯片的挑战。该项目的PI是普渡大学的一名女教员，将为女性和代表性不足的群体发挥榜样作用，鼓励她们攻读电气和计算机工程领域的学位，从而为未来劳动力的急需多样性做出贡献。为了管理缺陷行为的复杂性和可变性，使用故障模型作为缺陷的抽象表示，一套全面的测试旨在检测不同型号的故障。然而，来自不同模型的故障可能具有类似的测试，并且当测试不存在时，芯片的某些区域中的缺陷仍然未被发现。为了解决检测整个电子芯片中的缺陷的需要，在该项目中，将故障视为马赛克中的碎片，目标是确保马赛克是完整的。当马赛克的每个区域都被足够数量的碎片覆盖时，就达到了完整性。在故障方面，例如，通过定义一个新的故障模型来补充现有的故障模型，使得针对来自两个模型的故障的测试独立存在，来实现完整性。基于马赛克的方法将作为一个行业启发的框架的一部分来实施，该框架可以产生有关可能发生的缺陷的信息，并使用商业工具。

项目成果

期刊论文数量（20）

专著数量（0）

科研奖励数量（0）

会议论文数量（0）

专利数量（0）

Skewed-Load Tests for Transition and Stuck-at Faults

针对过渡和固定故障的斜负载测试

DOI：
10.1109/tcad.2018.2873233
发表时间：
2019
期刊：
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
影响因子：
2.9
作者：
Pomeranz, Irith
通讯作者：
Pomeranz, Irith

Broadside Tests for Transition and Stuck-At Faults

针对过渡和固定故障的全面测试

DOI：
10.1109/tcad.2019.2935046
发表时间：
2020
期刊：
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
影响因子：
2.9
作者：
Pomeranz, Irith
通讯作者：
Pomeranz, Irith

PRESERVE: Static Test Compaction that Preserves Individual Numbers of Tests

PRESERVE：静态测试压实，保留单独的测试数量

DOI：
10.1109/tcad.2020.3005371
发表时间：
2021
期刊：
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
影响因子：
2.9
作者：
Pomeranz, Irith
通讯作者：
Pomeranz, Irith

New Targets for Diagnostic Test Generation

DOI：
10.1109/tcad.2019.2928971
发表时间：
2020-10
期刊：
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
影响因子：
2.9
作者：
I. Pomeranz
通讯作者：
I. Pomeranz

Incomplete Tests for Undetectable Faults to Improve Test Set Quality

对无法检测到的故障进行不完整测试以提高测试仪质量