Development of an Ellipsometric Microscope for Measuring Liquid Surface Structure

用于测量液体表面结构的椭偏显微镜的开发

基本信息

  • 批准号:
    9625867
  • 负责人:
  • 金额:
    $ 9.78万
  • 依托单位:
  • 依托单位国家:
    美国
  • 项目类别:
    Standard Grant
  • 财政年份:
    1996
  • 资助国家:
    美国
  • 起止时间:
    1996-06-15 至 1998-11-30
  • 项目状态:
    已结题

项目摘要

Law 9625867 The structure of droplets or the texture of films at liquid surfaces are indicative of the underlying surface interaction forces, line tension and surface elasticity. The understanding of surface interactions is important in many physical, chemical, and biological processes. For example, surface interactions control the phase diagram of Langmuir films which are frequently used as model systems for biological membranes, surface interactions also control the spreading properties of a liquid droplet which is important in the understanding of lubrication, similarly surface interactions influence the orientation of liquid crystal molecules which are used in many modern optical devices. There are therefore many scientific and technologically important reasons for studying the structure of droplets and the texture of films at liquid surfaces. With this award, we will develop an improved ellipsometric microscope to study liquid surface structure. It overcomes various technical difficulties associated with a previous ellipsometric microscope design which could only study thin films or droplets on solid surfaces. For isotropic films or droplets at liquid surfaces the improved ellipsometric microscope can determine the film thickness as a function of position with ~0.1 nm thickness resolution and ~1 um spatial resolution, while for anisotropic films of known thickness and composition at a liquid surface the ellipsometric microscope can determine the variation in film anisotropy with ~l um spatial resolution. This instrument will be used to study the nucleation and growth of wetting droplets as they coalesce to a uniform wetting film. The instrument will also be used to study topological defects in freely suspended liquid crystal films of known thickness. The unbinding of disclinations and dislocations is believed to play an important role in the 2-D melting process of freely suspended liquid crystal films. %%% As far as we are aware this will be th e first instrument of its kind which can determine the absolute tilt angle of anisotropic films with micrometer spatial resolution (provided the film thickness is known). This instrument should therefore prove of general use in many other situations of interest to the scientific and industrial community. For example, it could be used to study tilt angle transitions and defects in Langmuir films. It could also be used in monitoring the quality control of anisotropic films in an industrial or research setting, for example, it can quantify the uniformity of hightemperature superconducting films or Langmuir-Blodgett layers. ***
第9625867号法律 液滴的结构或液体表面处的膜的纹理指示下面的表面相互作用力、线张力和表面弹性。表面相互作用的理解在许多物理,化学和生物过程中是重要的。 例如,表面相互作用控制常用作生物膜模型系统的朗缪尔膜的相图,表面相互作用还控制液滴的铺展性质,这在理解润滑中是重要的,类似地,表面相互作用影响在许多现代光学器件中使用的液晶分子的取向。 因此,有许多科学和技术上的重要原因,研究液滴的结构和液体表面的膜的纹理。 有了这个奖项,我们将开发一种改进的椭偏显微镜来研究液体表面结构。 它克服了与以前的椭偏显微镜设计,只能研究固体表面上的薄膜或液滴相关的各种技术困难。 对于液体表面的各向同性膜或液滴,改进的椭偏显微镜可以以~ 0.1nm的厚度分辨率和~1 μ m的空间分辨率确定膜厚度作为位置的函数,而对于液体表面的已知厚度和组成的各向异性膜,椭偏显微镜可以以~ 1 μ m的空间分辨率确定膜各向异性的变化。 该仪器将用于研究润湿液滴在凝聚成均匀润湿膜时的成核和生长。 该仪器还将用于研究已知厚度的自由悬浮液晶膜中的拓扑缺陷。 向错和位错的解束缚被认为在自由悬浮液晶膜的二维熔融过程中起着重要作用。 据我们所知,这将是第一台能够以微米级空间分辨率测定各向异性薄膜的绝对倾斜角的仪器(前提是薄膜厚度已知)。 因此,这一工具应证明在科学和工业界感兴趣的许多其他情况下具有普遍用途。 例如,它可以用来研究倾斜角转变和朗缪尔薄膜中的缺陷。 它还可以用于监测工业或研究环境中各向异性薄膜的质量控制,例如,它可以量化高温超导薄膜或Langmuir-Blodgett层的均匀性。 ***

项目成果

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Bruce Law其他文献

Highlights of the Faraday Discussion on Nanoparticle Synthesis and Assembly, Argonne, USA, April 2015.
法拉第关于纳米粒子合成和组装的讨论要点,美国阿贡,2015 年 4 月。
  • DOI:
    10.1039/c5cc90369f
  • 发表时间:
    2015
  • 期刊:
  • 影响因子:
    4.9
  • 作者:
    Xiao;Yugang Sun;E. Shevchenko;S. Sankaranarayanan;D. John;Igor Fedin;F. Bresme;H. Möhwald;P. Moriarty;C. Sorensen;Bruce Law
  • 通讯作者:
    Bruce Law

Bruce Law的其他文献

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{{ truncateString('Bruce Law', 18)}}的其他基金

Materials World Network: Electric Field Induced Microfluidic Manipulation
材料世界网络:电场诱导微流控
  • 批准号:
    0603144
  • 财政年份:
    2006
  • 资助金额:
    $ 9.78万
  • 项目类别:
    Continuing Grant
Acquisition of a Scanning Probe Microscope for Liquids Material Research and Student Training
采购用于液体材料研究和学生培训的扫描探针显微镜
  • 批准号:
    0216849
  • 财政年份:
    2002
  • 资助金额:
    $ 9.78万
  • 项目类别:
    Standard Grant
Interfacial Phenomena Near Phase Transitions
相变附近的界面现象
  • 批准号:
    0097119
  • 财政年份:
    2001
  • 资助金额:
    $ 9.78万
  • 项目类别:
    Continuing Grant
Interfacial Phenomena Near Critical Points
临界点附近的界面现象
  • 批准号:
    9631133
  • 财政年份:
    1997
  • 资助金额:
    $ 9.78万
  • 项目类别:
    Continuing Grant
Interfacial Phenomena at the Surfaces of Critical Ionic Mixtures
临界离子混合物表面的界面现象
  • 批准号:
    9500827
  • 财政年份:
    1995
  • 资助金额:
    $ 9.78万
  • 项目类别:
    Continuing Grant
The Kinetics of Nucleated Wetting at Critical Liquid Mixture Surfaces
临界液体混合物表面成核润湿的动力学
  • 批准号:
    9223872
  • 财政年份:
    1993
  • 资助金额:
    $ 9.78万
  • 项目类别:
    Standard Grant
Critical Adsorption in Finite and Semi-Infinite Systems: An Evanescent-Wave Ellipsometric Study
有限和半无限系统中的临界吸附:倏逝波椭圆测量研究
  • 批准号:
    9208123
  • 财政年份:
    1992
  • 资助金额:
    $ 9.78万
  • 项目类别:
    Standard Grant

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Principal effects of ternary oxide dielectric layers on SPR sensors for gas sensing with ellipsometric readout
三元氧化物介电层对椭圆偏振读出气体传感 SPR 传感器的主要影响
  • 批准号:
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Magneto-Optic and Ellipsometric study of nanostructured media
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界面过程的椭圆测量研究
  • 批准号:
    264506-2003
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    2003
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    Research Tools and Instruments - Category 1 (<$150,000)
Spectro-ellipsometric Analysis of Periodically Structured Samples
周期性结构样品的光谱椭圆分析
  • 批准号:
    15560031
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    2003
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A New Approach to Optical Microscopy of Sub-Wavelength Diffraction Structures: Shape Reconstruction from Ellipsometric Back-Focal-Plane Data
亚波长衍射结构光学显微镜的新方法:根据椭圆后焦平面数据进行形状重建
  • 批准号:
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    2002
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    $ 9.78万
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Imaging of a molecularly thin lubricant film on a magnetic disk by using ellipsometric microscopy
使用椭圆偏振显微镜对磁盘上的分子薄润滑膜进行成像
  • 批准号:
    13450065
  • 财政年份:
    2001
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用于设备应用的电子薄膜的椭偏表征
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U.S.-Chile Cooperative Research: Ellipsometric Studies of Alkane Selective Adsorption
美国-智利合作研究:烷烃选择性吸附的椭偏研究
  • 批准号:
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  • 财政年份:
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Exploratory Ellipsometric Studies of Silicon-Germanium- Carbon Alloys and Other Emerging Materials
硅锗碳合金和其他新兴材料的探索性椭偏研究
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    9413492
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    1994
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Critical Adsorption in Finite and Semi-Infinite Systems: An Evanescent-Wave Ellipsometric Study
有限和半无限系统中的临界吸附:倏逝波椭圆测量研究
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