Development of a New Scanning Tunneling Probe Microscope with Ultrahigh Charge/Current Detection Sensitivity for Electronic Characterization of Atomic Scale Structures

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9626286 Williams The objective of this project is to develop a new instrument based upon the integration of Scanning Tunneling Microscope (STM) and a modified Electrostatic Force Microscope (EFM). The new instrument called the Scanning Tunneling Charge Transfer Microscope (STCTM) will operate in an ultra-high vacuum chamber, and will provide a means to transfer single electrons to and from atomic scale surface structure with atomic spatial resolution. It will provide the ability to measure the electronic response of the surface to the transferred charge. Ultrasmall currents should also be measurable by the proposed scanning probe tips. The proposed work will significantly extend the capabilities of existing atomic scale characterization methods. The combination of ultrasmall charge/current detection and atomic spatial resolution provides a powerful tool for examining conducting and insulating nanostructure. These measurement capabilities should have a profound impact on materials research, especially in the area of nanostructured materials and devices. ***