Acquisition of Instrumentation for the Characterization of Rationally Synthesized Nanoscale Assemblies

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This award from the Chemistry Research Instrumentation and Facilities Program (CRIF) will assist the Department of Chemistry at The University of Oregon to acquire an atomic force microscope/scanning tunneling microscope (AFM/STM). This equipment, which is to be used for the characterization of rationally synthesized nanoscale assemblies, will enhance research in a number of areas, including (i) hybrid organic/inorganic self-assembled multilayers; (ii) ordered one- and two-dimensional nanocrystal arrays; (iii) thin-film conducting polymer interfaces; (iv) inorganic nanolaminates; and (v) semiconductor quantum dot materials and devices. The scanning tunneling microscope (STM) enables researchers to image atoms directly. The technique uses the piezoelectric effect which involves bringing an extremely sharp metal needle within a few angstroms of the sample surface. The distance is small enough for electrons to leak or tunnel across the gap and generate a minute current. As the gap between the tip and the sample increases, the current decreases. As the probe crosses the sample, moving back and forth across the surface, it traces out a contour map of the sample's surface atoms. The AFM is used in the control of material used to fabricate semiconductor circuits.