Purchase of a Powder-Thin-Film X-ray Diffraction System

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This award from the Chemistry Research Instrumentation and Facilities Program (CRIF) will assist the Department of Chemistry at Colorado State University in purchasing two powder X-ray diffraction systems that will complement each other as bulk powder analysis and thin film analysis instruments. The x-ray equipment will enhance research in a number of areas including the following: (1) rare earth Zintl materials, high pressure structural studies and thin film studies, (2) silicon based materials and polymerization, (3) conducting polymer nanostructures and nanostructures as secondary batteries, (4) Van der Waals epitaxy, electrochemical oxidation of superconductor thin films and epitaxial growth of chalcopyrite semiconductors, and (5) nonclassical metal carbonyls. The X-ray diffractometer is used to make accurate and precise measurements of the full three dimensional structure of a molecule. The information obtained gives the precise values of all the bond distances and bond angles of a given molecule and it gives accurate information about the spatial arrangement of the molecule relative to the neighboring molecules.