Purchase of a Powder-Thin-Film X-ray Diffraction System

这份来自化学研究仪器和设施项目（CRIF）的合同将帮助科罗拉多州立大学化学系购买两套粉末x射线衍射系统，这两套系统将作为散装粉末分析和薄膜分析仪器相互补充。x射线设备将加强以下领域的研究：(1)稀土Zintl材料，高压结构研究和薄膜研究，(2)硅基材料和聚合，(3)导电聚合物纳米结构和纳米结构作为二次电池，(4)范德华外延，超导体薄膜的电化学氧化和黄铜矿半导体的外延生长，以及(5)非经典金属羰基。x射线衍射仪用于对分子的完整三维结构进行精确的测量。所获得的信息给出了给定分子的所有键距和键角的精确值，并给出了分子相对于邻近分子的空间排列的准确信息。

This award from the Chemistry Research Instrumentation and Facilities Program (CRIF) will assist the Department of Chemistry at Colorado State University in purchasing two powder X-ray diffraction systems that will complement each other as bulk powder analysis and thin film analysis instruments. The x-ray equipment will enhance research in a number of areas including the following: (1) rare earth Zintl materials, high pressure structural studies and thin film studies, (2) silicon based materials and polymerization, (3) conducting polymer nanostructures and nanostructures as secondary batteries, (4) Van der Waals epitaxy, electrochemical oxidation of superconductor thin films and epitaxial growth of chalcopyrite semiconductors, and (5) nonclassical metal carbonyls. The X-ray diffractometer is used to make accurate and precise measurements of the full three dimensional structure of a molecule. The information obtained gives the precise values of all the bond distances and bond angles of a given molecule and it gives accurate information about the spatial arrangement of the molecule relative to the neighboring molecules.