SBIR Phase I: Ultrasensitive Methods for Tribology

SBIR 第一阶段：超灵敏摩擦学方法

• 批准号: 9861558
• 负责人: Andrzej Drukier
• 金额: $ 9.55万
• 依托单位: BioTraces Inc
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1999
• 资助国家: 美国
• 起止时间: 1999-01-01 至 1999-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9861558&HistoricalAwards=false
• 关键词: SBIR; Phase; Ultrasensitive; Methods; Tribology

9861558 This Small Business Innovation Research Phase I project is to develop methods and instrumentation which will permit evaluation of the thickness and integrity of thin film protective coatings on surfaces. The proposed techniques are based on the company's Multi Photon Detection (MPD) technology, a radioanalytic method which uses exempt amounts of radioisotope and provides 1,000 fold sensitivity improvements over current methods. By selectively incorporating appropriate radioactive tags in the protective surface film layer and imaging the surface distribution of the tags using the MPD Imager, the thickness and uniformity of the coating layers may be measured with unprecedented precision. Using this technique surface layer thickness can be measured down to monolayer levels. If successful, the techniques developed under this project could result in a powerful new tool for measuring the initial properties of surface coating layers and their behavior under diverse operating conditions. This tool will have widespread applicability in production and process control methods as well as the longer term monitoring of wear and corrosion effects in large mechanical systems.

9861558 这个小企业创新研究第一阶段项目是开发方法和仪器，这将允许表面上的薄膜保护涂层的厚度和完整性的评估。 所提出的技术基于该公司的多光子检测（MPD）技术，这是一种放射性分析方法，使用豁免量的放射性同位素，并提供比现有方法高1,000倍的灵敏度。 通过在保护性表面膜层中选择性地掺入适当的放射性标记物并使用MPD成像仪对标记物的表面分布进行成像，可以以前所未有的精度测量涂层的厚度和均匀性。 使用这种技术，表面层厚度可以测量到单层水平。 如果成功，在该项目下开发的技术可能会成为一种强大的新工具，用于测量表面涂层的初始性能及其在不同操作条件下的行为。 该工具将在生产和过程控制方法以及大型机械系统中磨损和腐蚀影响的长期监测中具有广泛的适用性。