Acquisition of x-ray diffraction equipment for study of matter at high-pressure and temperature for geophysical and materials science applications

采购 X 射线衍射设备，用于地球物理和材料科学应用的高压和高温物质研究

• 批准号: 0079641
• 负责人: Surendra Saxena
• 金额: $ 22.4万
• 依托单位: Florida International University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2000
• 资助国家: 美国
• 起止时间: 2000-08-01 至 2003-07-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0079641&HistoricalAwards=false
• 关键词: Acquisition; ray; diffraction; equipment; study

0079641SaxenaThis award provides 62% partial funding support for the acquisition of an X-ray microdiffractometer system to be installed and operated in the Department of Earth Science at Florida International University. The Florida International University is committed to providing the remaining funds necessary to acquire and install the system. The instrument system will be used for research and training of students in the fields of experimental geophysics, mineral physics, and materials science. Analytical applications will include characterization of the states of matter of samples subjected to extreme conditions of temperature and pressure mimicking ambient conditions deep in the Earth.***

0079641萨克森该奖项提供了62%的部分资金支持，用于购买将在佛罗里达国际大学地球科学系安装和运行的X射线微衍射仪系统。佛罗里达国际大学致力于提供必要的剩余资金来购买和安装该系统。该仪器系统将用于实验物理学、矿物物理学和材料科学领域的研究和学生培训。分析应用将包括对模拟地球深处环境条件的极端温度和压力条件下样品的物质状态进行表征。