Development of X-ray Diffraction Equipment for Research, Education, Training, and Outreach at a Synchrotron Source

开发用于同步加速器源的研究、教育、培训和推广的 X 射线衍射设备

基本信息

  • 批准号:
    0216881
  • 负责人:
  • 金额:
    $ 14.44万
  • 依托单位:
  • 依托单位国家:
    美国
  • 项目类别:
    Standard Grant
  • 财政年份:
    2002
  • 资助国家:
    美国
  • 起止时间:
    2002-08-15 至 2005-07-31
  • 项目状态:
    已结题

项目摘要

This award from the Instrumentation for Materials Research Program to Cornell University will allow several teams of investigators to develop x-ray diffraction instrumentation that will provide unique experimental capabilities and powerful general use equipment for use at the G2 experimental station at the Cornell High Energy Synchrotron Source (CHESS). A six-circle diffractometer, two CCD area detectors, and a temperature- and environment-controlled sample stage will be built. The diffractometer will allow for a very wide range of experimental configurations and will be the basic diffractometer for the G2 experimental station. The area detectors will be used at G2 for a variety of different experiments, but will also be made available to users at other experimental stations easing a current very high over demand for such detectors at CHESS and at Cornell. The stage will be able to hold samples at any temperature between 20 and 900 degrees C in a range of atmospheres during diffraction experiments and will also be used at different experimental stations. Together, this equipment will be optimized for high resolution and time-sensitive x-ray diffraction work. Initial work includes: 1) studies of mechanical deformation, relaxation, and anelastic recovery, as well as interactions among microstructure development, phase changes, and solid state reactions in thin films and nanopattened structures, 2) studies of the evolution of strain and magnetic and electronic properties as a function of controlled oxidation in magnetic oxide thin films and nanostructures, 3) studies of formation and structure of highly ordered arrays by metal initiated self-assembly of ligand modified den-drimers, and 4) studies of the kinetics of interface growth of metal mono- and multilayers. This equipment will be made available to outside users and to students, and will be used in outreach programs such as the Research Experiences for Teachers (RET) and Research Experiences for Undergraduates (REU) programs sponsored by NSF through the Cornell Center for Materials Research (CCMR).%%%This award from the Instrumentation for Materials Research Program to Cornell University will allow several teams of investigators to develop x-ray diffraction instrumentation that will provide unique experimental capabilities and powerful general use equipment for use at the G2 experimental station at the Cornell High Energy Synchrotron Source (CHESS). This equipment will be optimized for high resolution and time-sensitive x-ray diffraction work. It will be used to obtain rapid high resolution measurements of thermally induced phenomena in nanostructured materials, including strain, deformation, phase transformations, magnetic and electronic properties, film formation, and solid state reactions. This equipment will benefit a large number of research groups at Cornell, and also external US and international collaborators. It will be made available to outside users, to students, and will be used in outreach programs such as the very successful Research Experiences for Teachers (RET) and Research Experiences for Undergraduates (REU) programs sponsored by NSF through the Cornell Center for Materials Research (CCMR).
康奈尔大学材料研究计划仪器的这一奖项将允许几个研究团队开发X射线衍射仪器,该仪器将提供独特的实验能力和强大的通用设备,用于康奈尔高能同步加速器源(CHESS)的G2实验站。将建立一个六圆衍射仪,两个CCD面探测器,和一个温度和环境控制的样品台。衍射仪将允许非常广泛的实验配置,并将成为G2实验站的基本衍射仪。区域探测器将在G2用于各种不同的实验,但也将提供给其他实验站的用户,以缓解目前国际象棋和康奈尔大学对此类探测器的过度需求。该平台将能够在衍射实验期间将样品保持在20至900摄氏度之间的任何温度下,并且还将用于不同的实验站。总之,该设备将针对高分辨率和时间敏感的X射线衍射工作进行优化。初步工作包括:1)研究薄膜和纳米层结构中的机械变形、弛豫和滞弹性恢复,以及微结构发展、相变和固态反应之间的相互作用,2)研究作为磁性氧化物薄膜和纳米结构中受控氧化的函数的应变和磁性和电子性质的演变,3)金属引发配体修饰的树枝状大分子自组装形成高度有序阵列及其结构的研究; 4)金属单层和多层膜界面生长动力学的研究。该设备将提供给外部用户和学生,并将用于外展计划,如由NSF通过康奈尔材料研究中心(CCMR)赞助的教师研究经验(RET)和本科生研究经验(REU)计划。康奈尔大学材料研究计划仪器的这一奖项将允许几个研究团队开发X射线衍射仪器,该仪器将提供独特的实验能力和强大的通用设备,用于康奈尔高能同步加速器源(CHESS)的G2实验站。该设备将针对高分辨率和时间敏感的X射线衍射工作进行优化。它将用于获得纳米结构材料中热致现象的快速高分辨率测量,包括应变,变形,相变,磁性和电子特性,薄膜形成和固态反应。这些设备将使康奈尔大学的大量研究小组以及美国和国际合作者受益。它将提供给外部用户,学生,并将用于外展计划,如非常成功的教师研究经验(RET)和本科生研究经验(REU)计划,由NSF通过康奈尔大学材料研究中心(CCMR)赞助。

项目成果

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Shefford Baker其他文献

Shefford Baker的其他文献

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{{ truncateString('Shefford Baker', 18)}}的其他基金

Metastable phases in BCC thin films: formation, stability, and properties
BCC 薄膜中的亚稳态相:形成、稳定性和性能
  • 批准号:
    1810138
  • 财政年份:
    2018
  • 资助金额:
    $ 14.44万
  • 项目类别:
    Continuing Grant
Driving forces and orientation selection during texture transformations in thin metal films
金属薄膜织构转变过程中的驱动力和方向选择
  • 批准号:
    1411024
  • 财政年份:
    2014
  • 资助金额:
    $ 14.44万
  • 项目类别:
    Continuing Grant
Texture and Texture Transformations in Thin Metal Films
金属薄膜中的纹理和纹理变换
  • 批准号:
    1106223
  • 财政年份:
    2011
  • 资助金额:
    $ 14.44万
  • 项目类别:
    Continuing Grant
Microstructure and Mechanical Behavior of Tantalum Thin Films
钽薄膜的微观结构和机械性能
  • 批准号:
    0706507
  • 财政年份:
    2007
  • 资助金额:
    $ 14.44万
  • 项目类别:
    Continuing Grant
US-France Cooperative Research: Inhomogeneous Strains in Thin Films and Nanostructures
美法合作研究:薄膜和纳米结构中的不均匀应变
  • 批准号:
    0233283
  • 财政年份:
    2003
  • 资助金额:
    $ 14.44万
  • 项目类别:
    Standard Grant
Stresses, Deformation, and Dislocations in Thin Films: Combining Modeling and Simulations with Experiments
薄膜中的应力、变形和位错:将建模、仿真与实验相结合
  • 批准号:
    0311848
  • 财政年份:
    2003
  • 资助金额:
    $ 14.44万
  • 项目类别:
    Continuing Grant
Acquisition of an Atomic Force Microscope for Mechanical and Magnetic Property Measurements in Small Dimensions and Student Training
获取用于小尺寸机械和磁性测量的原子力显微镜和学生培训
  • 批准号:
    9975924
  • 财政年份:
    1999
  • 资助金额:
    $ 14.44万
  • 项目类别:
    Standard Grant
CAREER: Deformation Mechanisms in Thin Metal Films
职业:金属薄膜的变形机制
  • 批准号:
    9875119
  • 财政年份:
    1999
  • 资助金额:
    $ 14.44万
  • 项目类别:
    Continuing Grant
U.S.-Germany Cooperative Research: Stresses and Deformation Mechanisms in Thin Metal Films
美德合作研究:金属薄膜中的应力和变形机制
  • 批准号:
    9815702
  • 财政年份:
    1999
  • 资助金额:
    $ 14.44万
  • 项目类别:
    Standard Grant

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用于病理学的组合 X 射线透射和衍射成像系统的开发和评估
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Development and Application of Novel X-Ray Diffraction and Scattering Methods for the study of Crystalline, Amorphous, and Nanoscale Materials
用于研究晶体、非晶和纳米材料的新型 X 射线衍射和散射方法的开发和应用
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    RGPIN-2017-06453
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Development of a Versatile Electrolysis Flow Cell For In Operando X-Ray Diffraction Studies
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    2742546
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Development and Application of Novel X-Ray Diffraction and Scattering Methods for the study of Crystalline, Amorphous, and Nanoscale Materials
用于研究晶体、非晶和纳米材料的新型 X 射线衍射和散射方法的开发和应用
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Development and Application of Novel X-Ray Diffraction and Scattering Methods for the study of Crystalline, Amorphous, and Nanoscale Materials
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  • 批准号:
    19H02747
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  • 批准号:
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