Semiconducting Diamond: Electrochemistry, Doping and Theoretical Studies

半导体金刚石：电化学、掺杂和理论研究

• 批准号: 0314688
• 负责人: John Angus
• 金额: $ 57.5万
• 依托单位: Case Western Reserve University
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 2003
• 资助国家: 美国
• 起止时间: 2003-07-15 至 2007-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0314688&HistoricalAwards=false
• 关键词: Semiconducting; Diamond; Electrochemistry; Doping; Theoretical

AbstractCHE-0314688Angus/Case Western This research collaboration involving John Angus, Alfred Anderson, and Heidi Martin and their students at Case Western Reserve University investigates the fundamental interactions between the surface chemistry, electronic structure, and charge transport at conducting diamond surfaces. With the support of the Analytical and Surface Chemistry Program, a research project focusing on the growth of boron and sulfur doped diamond films, characterization of these films by electrical, optical, structural, and electrochemical methods, and spectroscopic characterization of adsorbates and their effect on surface conductivity is being undertaken. Ab-initio calculations are used to interpret the results of this experimental work. Proof of concept design of new sensors based on the surface conductivity of diamond induced by adsorption is being carried out. A detailed understanding of the effects of adsorption on the conductivity and electronic properties of diamond electrode surfaces can be used to develop new sensor strategies. A combined experimental and theoretical research effort is being carried out to address these questions in the growth and characterization of diamond thin films.

来自凯斯西储大学的John Angus、Alfred Anderson、Heidi Martin和他们的学生合作研究了导电金刚石表面的表面化学、电子结构和电荷输运之间的基本相互作用。在分析和表面化学项目的支持下，一项研究项目侧重于硼和硫掺杂金刚石薄膜的生长，通过电学、光学、结构和电化学方法对这些薄膜进行表征，并对吸附物及其对表面电导率的影响进行光谱表征。用从头算来解释实验工作的结果。基于吸附诱导的金刚石表面电导率的新型传感器的概念设计正在进行验证。详细了解吸附对金刚石电极表面电导率和电子性能的影响可以用于开发新的传感器策略。为了解决金刚石薄膜生长和表征中的这些问题，目前正在进行实验和理论相结合的研究。