NER: Measuring Atomic Size Objects on Electrically Insulating Surfaces in Ultrahigh Vacuum

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This proposal was received in response to Nanoscale Science and Engineering initiative, NSF 04-043, category Nanoscale Exploratory Research. The objective of this work is to research carbon nanotube probe tips that can be used for both atomic force microscopy and scanning tunneling microscopy in an ultrahigh vacuum environment. These new tips will be prepared in air and then used in vacuum to image metallic particles a few atoms in height on flat surfaces. The experimental results will be compared with calculations that predict the dependence of the apparent height and lateral extent of a particle on the structure of the particle, the composition of the particle and the substrate, and the size of the tip apex.This research aims to develop a novel tool to measure prototype nanometer-scale objects that are produced in the development of nanometer-scale manufacturing processes. The research results will be integrated into the education program, including seminars, a special topics course in scanning probe microscopy, and in the yearly frontiers of nanotechnology course. A diverse group of students will receive training in the critical use of these measurement techniques.