NER: Measuring Atomic Size Objects on Electrically Insulating Surfaces in Ultrahigh Vacuum

该提案是响应纳米科学和工程倡议，NSF 04-043，类别纳米探索性研究。 本工作的目的是研究碳纳米管探针，可用于原子力显微镜和扫描隧道显微镜在微真空环境中。这些新的尖端将在空气中制备，然后在真空中用于在平面上成像几个原子高度的金属颗粒。将实验结果与预测颗粒的表观高度和横向范围对颗粒结构、颗粒和衬底的组成以及尖端apex的大小的依赖性的计算进行比较。本研究旨在开发一种新的工具来测量在纳米级制造工艺的发展中产生的原型纳米级物体。 研究成果将被纳入教育计划，包括研讨会，扫描探针显微镜的专题课程，以及纳米技术课程的年度前沿。一个不同的学生群体将接受培训，在这些测量技术的关键使用。

This proposal was received in response to Nanoscale Science and Engineering initiative, NSF 04-043, category Nanoscale Exploratory Research. The objective of this work is to research carbon nanotube probe tips that can be used for both atomic force microscopy and scanning tunneling microscopy in an ultrahigh vacuum environment. These new tips will be prepared in air and then used in vacuum to image metallic particles a few atoms in height on flat surfaces. The experimental results will be compared with calculations that predict the dependence of the apparent height and lateral extent of a particle on the structure of the particle, the composition of the particle and the substrate, and the size of the tip apex.This research aims to develop a novel tool to measure prototype nanometer-scale objects that are produced in the development of nanometer-scale manufacturing processes. The research results will be integrated into the education program, including seminars, a special topics course in scanning probe microscopy, and in the yearly frontiers of nanotechnology course. A diverse group of students will receive training in the critical use of these measurement techniques.