MRI: Acquisition of a Dual Beam Focused Ion Beam System as a Regional Resource for Collaborative Research and Education in Missouri

MRI：采购双束聚焦离子束系统作为密苏里州合作研究和教育的区域资源

• 批准号: 0723128
• 负责人: Frank Miller
• 金额: $ 50万
• 依托单位: Missouri University of Science and Technology
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2007
• 资助国家: 美国
• 起止时间: 2007-09-01 至 2008-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0723128&HistoricalAwards=false
• 关键词: MRI; Acquisition; Dual; Beam; Focused

Technical AbstractThe acquisition of a dual beam focused ion beam / scanning electron microscope (FIB/SEM) instrument capable of cross-sectional imaging, in-situ sectioning and transmission electron microscope (TEM) sample preparation, and nano-scale selective etching and deposition will complement and expand the materials analysis capabilities of the Advanced Materials Characterization Lab (AMCL) at the University of Missouri-Rolla (UMR). The FIB/SEM will be utilized in projects that will develop nonvolatile memory devices and microfluidics-based biochemical sensors, environmentally sound aircraft coatings, innovative laser joining and deposition techniques, nanophase aluminum alloys via the friction-stir process, electrodeposited spintronic materials, chiral structures, and new techniques to analyze fluid inclusions and investigate two-phase and multi-phase nanofluidics. These projects represent only a fraction of the tasks that UMR faculty have proposed for the new instrumentation. Never before has the acquisition of a piece of equipment spurred such a high level of interest on our campus. Acquisition of this FIB/FESEM will not only enhance the capabilities and collaborations of research faculty on the UMR campus, but will benefit research being done throughout the State of Missouri. Other institutions that will benefit from the acquisition of this equipment include the Research Alliance of Missouri and the Missouri Nanoalliance, organizations dedicated to facilitating collaborative nanoscience research and facility development in the State of Missouri. The FIB/FESEM will allow graduate students working in many different materials and manufacturing research areas on campus to more fully and efficiently characterize thin films, interfaces, coatings, and many other applications. This state-of-the-art equipment will also enhance recruitment efforts at the undergraduate and graduate levels at UMR through programs such as the Opportunities for Undergraduate Research Experience (OURE). In addition, the instrument will be utilized to generate excitement among the K-12 students who participate in UMR's many pre-college programs. Non-technical AbstractLooking into the incredible world of nano-technology, 10,000 times smaller than the human hair, requires sophisticated equipment that can image many of the mysteries that escape the naked eye. Even better, being able to look beneath the surface of nano-structures and nano-materials reveals details otherwise lost. Combining the ability to both cut and image nanosystems, a focused ion beam / scanning electron microscope (FIB/SEM) enables engineers and scientists to investigate topics as wide ranging as synthetic bone replacements to semiconductor chips to stronger metals to environmentally friendly coatings that protect aircraft from corroding. Like ideas seen in Jurassic Park, where DNA is extracted from old fossils, the FIB/SEM can cut away the outer layers of centuries old biological samples and probe their characteristics to understand how they functioned. Unlocking the imagination of college students and researchers, the FIB/SEM at the University of Missouri-Rolla will be the first one of its kind in the state of Missouri, and will be utilized on numerous interdisciplinary projects between materials scientists, chemists, engineers, biologists and physicists. It will also reach out to the over 1,000 K-12 students that visit and tour the campus each year during field trips and summer camps in the hope to spark interest in the physical sciences for the next generation of scientists and engineers.

技术摘要双束聚焦离子束/扫描电子显微镜（FIB/SEM）仪器的收购能够横截面成像，原位切片和透射电子显微镜（TEM）样品制备，和纳米级的选择性蚀刻和沉积将补充和扩大材料分析能力的先进材料表征实验室（AMCL）在密苏里大学罗拉（UMR）。FIB/SEM将用于开发非易失性存储设备和基于微流体的生物化学传感器、环保飞机涂层、创新的激光连接和沉积技术、通过摩擦搅拌工艺的纳米相铝合金、电沉积自旋电子材料、手性结构以及分析流体包裹体和研究两相和多相纳米流体的新技术的项目。这些项目只是UMR教师为新仪器提出的任务的一小部分。以前从未有一件设备的收购激发了我们校园里如此高的兴趣。收购这个FIB/FESEM不仅将提高UMR校园研究人员的能力和合作，而且将有利于整个密苏里州正在进行的研究。其他机构将受益于购买这种设备包括研究联盟的密苏里州和密苏里州纳米联盟，组织致力于促进合作纳米科学研究和设施的发展在密苏里州。FIB/FESEM将允许在校园内许多不同材料和制造研究领域工作的研究生更全面，更有效地表征薄膜，界面，涂层和许多其他应用。这种最先进的设备还将通过本科生研究经验机会（OURE）等计划加强UMR本科生和研究生水平的招聘工作。此外，该仪器将被用来在参加UMR许多大学预科课程的K-12学生中产生兴奋。 纳米技术比人类的头发还小一万倍，要想进入这个不可思议的纳米技术世界，需要先进的设备，这些设备可以描绘出许多肉眼无法看到的奥秘。更妙的是，能够看到纳米结构和纳米材料表面之下的细节，否则就会丢失。结合切割和成像纳米系统的能力，聚焦离子束/扫描电子显微镜（FIB/SEM）使工程师和科学家能够研究从合成骨替代物到半导体芯片，从更坚固的金属到保护飞机免受腐蚀的环保涂层等广泛的主题。就像在《侏罗纪公园》中看到的想法一样，DNA是从古老的化石中提取的，FIB/SEM可以切掉几个世纪前的生物样本的外层，并探测它们的特征，以了解它们是如何运作的。 释放大学生和研究人员的想象力，密苏里大学罗拉分校的FIB/SEM将成为密苏里州的第一个同类产品，并将用于材料科学家，化学家，工程师，生物学家和物理学家之间的许多跨学科项目。它还将接触到每年在实地考察和夏令营期间访问和参观校园的1,000多名K-12学生，希望激发下一代科学家和工程师对物理科学的兴趣。