MRI: Acquisition of Dual Beam FIB/SEM to Enable New Capability for Research, Education and Training at UDC

MRI：收购双束 FIB/SEM 为 UDC 的研究、教育和培训提供新能力

• 批准号: 2022090
• 负责人: Lei Wang
• 金额: $ 51.17万
• 依托单位: University of the District of Columbia
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2020
• 资助国家: 美国
• 起止时间: 2020-09-01 至 2022-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=2022090&HistoricalAwards=false
• 关键词: MRI; Acquisition; Dual; Beam; FIB

Nontechnical:The Major Research Instrumentation award allows the acquisition of a focused ion beam integrated with a scanning electron microscope at the University of the District of Columbia (UDC). This instrument will aid UDC, a historically black college and university, in its goal to transform into an effective urban research institution serving a diverse student population. The instrument can produce high resolution images with nanoscale resolution of surfaces, cross-sections and three-dimensional structures. Characterization and analysis at the nanoscale will promote and benefit faculty and student research in the cutting-edge research fields of national needs. The instrument will enable multidisciplinary research at UDC into a wide range of fields. These include magnetic devices for control systems, solar cell for energy harvesting, nanomaterials and nanodevices for thermal management and energy systems, soil improvement for hazard mitigation, and water resources recovery techniques for sustainability. This instrument will be a key component of UDC’s research infrastructure. The instrument will also play a critical role in the education and training of undergraduate and graduate students from a broad spectrum of STEM disciplines. The activities enabled by the instrument will enrich students’ educational experience and provide rewarding research training. The instrument will foster partnerships with surrounding universities and community colleges to provide experiential learning to students. Educational resources on microscopy will be disseminated through workshops and engineering open houses to teachers and high school students. These activities will introduce of K-12 students to the fundamental concepts and techniques of microscopy.Technical:The Dual Beam Focused Ion Beam Scanning Electron Microscope (SEM/FIB) delivers superior performance to analyze three-dimensional structural characterization and compositional information of engineered and natural materials at nano-scale resolution. The FIB uses the milling function to create cross section inside the material that illustrates its internal structure at the nano-scale. The FIB/SEM complements the existing nanotechnology and characterization resources at UDC and provides much-needed capabilities in the areas of high-resolution imaging, depth profiling and 3D reconstruction, and chemical spectroscopy at the nanoscale to catalyze new scientific discoveries. It will serve as an indispensable tool for research that will create and enhance (i) understanding and fabrication of novel, direct-write nanofluidic structures; (ii) knowledge about the effect of ferromagnetic (FM) electrode composition on magnetic and transport properties of magnetic tunnel junction based molecular spintronics devices (MTJMSDs); (iii) fundamental understanding of the energetics of phase change inside self-assembled nano-micelle-based materials; (iv) understanding the correlation between nanowire microstructure and fabrication conditions as well as the resulting photovoltaic performance; (v) understanding of the nano-micro mechanisms of microbially induced calcite precipitation (MICP) and other mineral precipitation processes and their effects on the macro mechanical properties of sand and silty soils; and (vi) knowledge about the prevention of uncontrolled precipitation and dissolution of the minerals struvite/vivianite as well as biodegradation or chemical cleavage of metal-chelate complex to recover it in a controlled environment. The instrument will set the stage for increased levels of interdisciplinary collaborations in the fields of nanoscale electronic and optoelectronic devices, advanced manufacturing, nanotechnology for renewable energy as well as environmental and geotechnical engineering applications across different disciplines and institutions.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.

非技术：主要的研究仪器奖允许在哥伦比亚大学（UDC）大学（UDC）的扫描电子显微镜集成的集合离子光束中获得。该工具将帮助UDC（历史悠久的黑人学院和大学），目的是将其转变为一种有效的城市研究工具，为潜水员的学生人数提供服务。该仪器可以通过纳米级分辨率，横截面和三维结构产生高分辨率图像。纳米级的表征和分析将在国家需求的尖端研究领域促进和利益教师和学生研究。该仪器将使UDC的多学科研究能够进入广泛的领域。其中包括用于控制系统的磁性设备，用于收获能源的太阳能电池，用于热管理和能源系统的纳米材料和纳米材料，危害缓解的土壤改善以及可持续性的水资源回收技术。该工具将是UDC研究基础架构的关键组成部分。该乐器还将在来自广泛的STEM学科的本科生和研究生的教育和培训中发挥关键作用。乐器启用的活动将丰富学生的教育经验，并提供有意义的研究培训。该工具将与周围的大学和社区大学建立伙伴关系，为学生提供学习经验。有关显微镜的教育资源将通过讲习班和工程开放式房屋传播给教师和高中生。这些活动将向K-12学生介绍显微镜的基本概念和技术。技术：双光束聚焦的离子束扫描电子显微镜（SEM/FIB）提供了卓越的性能，可以分析三维结构性表​​征和纳米尺度分辨率的工程和天然材料的组成和天然材料的组成信息。 FIB使用铣削函数在材料内部创建横截面，以说明其内部结构在纳米尺度上。 FIB/SEM符合UDC上现有的纳米技术和表征资源，并在高分辨率成像，深度分析和3D重建方面提供了急需的功能，以及纳米级的化学光谱学以催化新的科学发现。它将作为必不可少的研究工具，将创建和增强（i）对新颖的，直接的纳米流体结构的理解和制造； （ii）有关铁电磁（FM）电极组成对基于磁性隧道连接的磁性和传输特性的影响的知识； （iii）对自组装的纳米微粒材料内相变的能量的基本理解； （iv）了解纳米线微观结构与制造条件以及所得的光伏性能之间的相关性； （v）了解微生物诱导的钙降水（MICP）和其他矿物沉淀过程的纳米微微粒机制及其对沙子和粉质土壤的宏观机械性能的影响； （vi）知道预防矿物质/乙烯酸矿石的矿物质/维氏矿物的不受控制的降水和溶解，以及金属氯酸盐复合物的生物降解或化学裂解，以在受控的环境中恢复它。该乐器将为在纳米级电子和光电设备，高级制造，可再生能源的纳米技术以及环境和岩土技术工程应用以及不同学科和机构跨不同学科和机构进行的环境和岩土工程应用中提高跨学科合作的水平奠定阶段。影响审查标准。