MRI: Acquisition of a Time-of-Flight Secondary Ion Mass Spectrometer

MRI：购买飞行时间二次离子质谱仪

• 批准号: 0923096
• 负责人: Keith Stevenson
• 金额: $ 69.86万
• 依托单位: University of Texas at Austin
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2009
• 资助国家: 美国
• 起止时间: 2009-10-01 至 2011-09-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0923096&HistoricalAwards=false
• 关键词: MRI; Acquisition; Time; Flight; Secondary

0923096BarbaraU. Texas Austin"This award is funded under the American Recovery and Reinvestment Act of 2009 (Public Law 111-5)."Technical Summary: Researchers at the University of Texas at Austin are requesting the purchase of a cutting-edge time-of-flight secondary ion mass spectrometer (TOF-SIMS) for spectroscopy, imaging, and sputter depth profiling of a large variety of solid samples. This TOF-SIMS features several notable attributes, including ~100 nm lateral resolution and spatial resolution of ~2 nm in the z-direction, ppb-level chemical sensitivity, three-dimensional chemical mapping capabilities and depth profiling with minimal damage by means of C60+ and Au+ cluster ion sources. We have selected an instrument configuration that addresses the analysis needs of our broad spectrum of users, whose samples include inorganic, organic, polymer, bio- and nanomaterials and whose research projects range from printable photovoltaics to polymeric biomaterials to nanoscale LEDs. Several complementary surface analysis instruments (e.g., XPS, SEM) exist at UT-Austin, but no single instrument is currently available that provides minimally destructive, highly spatially-resolved imaging and highly sensitive chemical analysis on µm to nm length scales and that is suitable for all of these diverse projects. The proposed instrument will be managed by and housed within UT-Austin?s Center for Nano- and Molecular Science and Technology, and will be accessible 24 hours a day, 365 days a year for hands-on analysis by student and faculty users. This proposed instrument has generated an unprecedented level of interest and support from faculty and students spanning eight academic departments at UT-Austin, and we fully expect that the TOF-SIMS will be regularly utilized by a greater variety of academic units than any other single instrument on campus. Use of the instrument will be extended to other nearby Texas universities as well as interested industrial researchers. Layman Summary: The success of research activities for modern materials and devices, including semiconductor films for computer chips, low-cost materials for solar cells, and pattered devices for cancer detection in cells, is dependent on the ability to obtain chemical information on these materials at nanometer-scale spatial resolution and with high chemical sensitivity. In this regard, time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been established as an analytical technique that is becoming one of the most powerful tools in materials research. TOF-SIMS uses a pulsed primary ion beam to desorb and ionize atomic and molecular species from a sample surface. These secondary ions then are accelerated into a time-of-flight mass spectrometer, where they are separated according to their unique mass and analyzed for prevalence in the sample. TOF-SIMS can also be used to obtain two- and three-dimensional sample images with chemical contrast by scanning the focused ion beam across the sample surface. TOF-SIMS has been used traditionally to analyze conducting and semiconducting samples with exceptional sensitivity. However, the recent introduction of new types of ion beams that are less harsh than conventional beams has made TOF-SIMS an ideal technique for the ultra-sensitive analysis of delicate organic, polymeric, and biological samples as well. Owing to its broad applicability, researchers at the University of Texas at Austin have proposed the acquisition of a state-of-the-art TOF-SIMS instrument equipped with multiple ion beams to be utilized in the analysis of a variety of samples used in ongoing research projects in eight disciplines of science and engineering, including chemistry, physics, pharmacy and electrical engineering. The TOF-SIMS will be available 24 hours a day, 7 days a week for hands-on use by students and faculty both at UT-Austin and at other nearby Texas universities, as well as interested industrial researchers.

0923096 barbarau。“该奖项是根据2009年美国复苏和再投资法案（公法111-5）资助的。”技术概述：德克萨斯大学奥斯汀分校的研究人员正在申请购买一台尖端的飞行时间二次离子质谱仪（TOF-SIMS），用于各种固体样品的光谱、成像和溅射深度分析。这种TOF-SIMS具有几个显著的属性，包括~100 nm的横向分辨率和~2 nm的z方向空间分辨率，ppb级的化学灵敏度，三维化学绘图能力和深度剖面，通过C60+和Au+簇离子源的最小损伤。我们选择了一种仪器配置，以满足我们广泛用户的分析需求，其样品包括无机，有机，聚合物，生物和纳米材料，其研究项目范围从可打印光伏到聚合物生物材料再到纳米级led。UT-Austin有几种互补的表面分析仪器（例如，XPS， SEM），但目前没有一种仪器可以提供最小破坏性，高空间分辨率成像和高灵敏度的μ m到nm长度尺度的化学分析，并且适合所有这些不同的项目。拟议的仪器将由UT-Austin？每年365天，每天24小时，供学生和教师用户进行动手分析。这一提议的仪器已经引起了德克萨斯大学奥斯汀分校八个学术部门的教职员工和学生前所未有的兴趣和支持，我们完全期望TOF-SIMS将被更广泛的学术单位定期使用，而不是校园内任何其他单一仪器。该仪器的使用将扩展到附近的其他德克萨斯大学以及感兴趣的工业研究人员。摘要：现代材料和器件研究活动的成功，包括用于计算机芯片的半导体薄膜，用于太阳能电池的低成本材料，以及用于细胞中癌症检测的图案器件，都依赖于以纳米尺度空间分辨率和高化学灵敏度获取这些材料化学信息的能力。在这方面，飞行时间二次离子质谱（TOF-SIMS）已经成为一种分析技术，正在成为材料研究中最强大的工具之一。TOF-SIMS使用脉冲主离子束从样品表面解吸和电离原子和分子物种。然后，这些次级离子被加速到飞行时间质谱仪中，在那里它们根据其独特的质量被分离，并分析样品中的流行程度。TOF-SIMS还可以通过扫描聚焦的离子束穿过样品表面来获得具有化学对比度的二维和三维样品图像。TOF-SIMS传统上用于分析导电和半导体样品，具有特殊的灵敏度。然而，最近引入的新型离子束比传统离子束不那么苛刻，使得TOF-SIMS成为对精细有机、聚合物和生物样品进行超灵敏分析的理想技术。由于其广泛的适用性，德克萨斯大学奥斯汀分校的研究人员提议购买一台配备多离子束的最先进的TOF-SIMS仪器，用于分析科学和工程八个学科（包括化学、物理、制药和电气工程）正在进行的研究项目中使用的各种样品。TOF-SIMS将每周7天，每天24小时开放，供UT-Austin和附近其他德克萨斯大学的学生和教师以及感兴趣的工业研究人员实际使用。