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Advanced Methods for Nano-Characterisation

Advanced Methods for Nano-Characterisation
纳米表征的先进方法
批准号:
195216193
负责人:
Professor Dr. Dietrich R. T. Zahn, since 12/2014
金额:
$0.0万
依托单位:
依托单位国家:
德国
项目类别:
Research Units
财政年份:
2011
资助国家:
德国
项目状态:
已结题
起止时间:
2010-12-31 至 2017-12-31

项目摘要

项目成果

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中文摘要
翻译
在第一个资助期开发的纳米表征方法的应用及其进一步改进对于SMINT项目的全面成功至关重要。到目前为止所获得的结果是非常有希望的,TERS和c-AFM/KPFM将被用于精细传感器结构的表征。结果将有助于这些结构的优化,反之亦然,将允许进行更精确的测量;例如,如果只有一个手性的碳纳米管形成传感器,则可以更准确地确定应变或温度变化引起的影响。将特别注意在操作条件下测量传感器。进一步的实验方法将拓宽纳米表征的光谱。其中包括亚纳米分辨率的扫描隧道显微镜(STM)和横向分辨率为1m(-SE)的椭圆偏振光谱。用-SE法可以测定介电沉积的碳纳米管的各向异性光学性质。相应的结果为光学性质的建模提供了输入。-SE还可以在传感器运行期间应用,以便可以测量例如由于应变而引起的光学特性的变化。此外,椭圆偏振测量仪的设置允许实施其他方法,例如拉曼光谱。为此,将对现有拉曼光谱仪的远程头部进行改进,以便可以使用椭圆偏振光谱和拉曼光谱以类似的横向分辨率来研究相同的样品位置。这种结合对于功能化碳纳米管的研究特别有意义,因为纳米粒子的功能化将显著改变其光学性质,并通过金属纳米粒子在拉曼光谱中诱导SERS。最后,这种-SE和拉曼光谱的结合也将应用于卷起的智能管。该项目的目标可概括为:应用和进一步优化在项目阶段开发的纳米表征方法,即TERS和c-AFM/KPFM,特别关注传感器操作过程中的应用(原位分析);将STM作为扫描探针技术的进一步组成部分,用于碳纳米管和基于它们的传感器/结构的纳米表征,分辨率可达亚纳米区域。使用-SE和拉曼光谱相结合的方法测定碳纳米管结构和智能管的各向异性光学性质。
英文摘要
The application of the methods for nano-characterisation developed during the first funding period and their further improvement are essential for the overall success of the SMINT project. Results obtained so far are very promising and TERS as well as c-AFM/KPFM shall be employed for the characterization of refined sensor structures. The results will contribute to the optimization of these structures and the refined structures will vice versa allow more precise measurements to be performed; e.g. if CNTs of only one chirality form the sensor then effects induced by strain or temperature variation can be determined with higher accuracy. Special attention will be devoted to measuring sensors under operating conditions.Further experimental methods will broaden the spectrum of nano-characterisation. Amongst those are scanning tunneling microscopy (STM) with sub-nanometer resolution and spectroscopic ellipsometry with a lateral resolution of 1 m (-SE). With -SE anisotropic optical properties of CNTs deposited by dielectrophoresis can be determined. Corresponding results deliver the input for the modelling of the optical properties. -SE can also be applied during the operation of the sensors so that changes of the optical properties e.g. due to strain can be measured. Moreover, the ellipsometry setup allows other methods to be implemented, e.g. Raman spectroscopy. For this purpose the remote head of an existing Raman spectrometer will be modified so that the same sample position can be investigated with comparable lateral resolution using spectroscopic ellipsometry as well as Raman spectroscopy. This combination is particularly interesting for studies of functionalized CNTs, since the functionalization with nanoparticles will alter the optical properties markedly and induce SERS in the Raman spectra via the metallic nanoparticles. Finally this combination of -SE and Raman spectroscopy will also be applied to rolled-up smart tubes. Here the optical properties can be monitored as a function of tube filling with high lateral resolution.The project aims can be summarized as follows:Application and further optimization of the methods for nano-characterisation which were developed during the project phase, namely TERS and c-AFM/KPFM, with special attention devoted to the application during sensor operation (in situ analytics).Integration of STM as a further component of the scanning probe techniques for the nanocharacterisation of CNTs and sensors/structures based on them with resolution down to the sub-nanometer region.Determination of anisotropic optical Properties of CNT structures and smart tubes using the combination of -SE and Raman spectroscopy.
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