Advanced Methods for Nano-Characterisation

纳米表征的先进方法

• 批准号: 195216193
• 负责人: Professor Dr. Dietrich R. T. Zahn, since 12/2014
• 金额: --
• 依托单位: Institut für Physik
• 依托单位国家: 德国
• 项目类别: Research Units
• 财政年份: 2011
• 资助国家: 德国
• 起止时间: 2010-12-31 至 2017-12-31
• 项目状态: 已结题
• 来源: https://gepris.dfg.de/gepris/projekt/195216193?language=en
• 关键词: Advanced; Methods; Nano; Characterisation

The application of the methods for nano-characterisation developed during the first funding period and their further improvement are essential for the overall success of the SMINT project. Results obtained so far are very promising and TERS as well as c-AFM/KPFM shall be employed for the characterization of refined sensor structures. The results will contribute to the optimization of these structures and the refined structures will vice versa allow more precise measurements to be performed; e.g. if CNTs of only one chirality form the sensor then effects induced by strain or temperature variation can be determined with higher accuracy. Special attention will be devoted to measuring sensors under operating conditions.Further experimental methods will broaden the spectrum of nano-characterisation. Amongst those are scanning tunneling microscopy (STM) with sub-nanometer resolution and spectroscopic ellipsometry with a lateral resolution of 1 m (-SE). With -SE anisotropic optical properties of CNTs deposited by dielectrophoresis can be determined. Corresponding results deliver the input for the modelling of the optical properties. -SE can also be applied during the operation of the sensors so that changes of the optical properties e.g. due to strain can be measured. Moreover, the ellipsometry setup allows other methods to be implemented, e.g. Raman spectroscopy. For this purpose the remote head of an existing Raman spectrometer will be modified so that the same sample position can be investigated with comparable lateral resolution using spectroscopic ellipsometry as well as Raman spectroscopy. This combination is particularly interesting for studies of functionalized CNTs, since the functionalization with nanoparticles will alter the optical properties markedly and induce SERS in the Raman spectra via the metallic nanoparticles. Finally this combination of -SE and Raman spectroscopy will also be applied to rolled-up smart tubes. Here the optical properties can be monitored as a function of tube filling with high lateral resolution.The project aims can be summarized as follows:Application and further optimization of the methods for nano-characterisation which were developed during the project phase, namely TERS and c-AFM/KPFM, with special attention devoted to the application during sensor operation (in situ analytics).Integration of STM as a further component of the scanning probe techniques for the nanocharacterisation of CNTs and sensors/structures based on them with resolution down to the sub-nanometer region.Determination of anisotropic optical Properties of CNT structures and smart tubes using the combination of -SE and Raman spectroscopy.

在第一个资助期内开发的纳米表征方法的应用及其进一步改进对于SMINT项目的整体成功至关重要。目前得到的结果是非常有希望的，应该使用TERS和c-AFM/KPFM来表征精细的传感器结构。这些结果将有助于这些结构的优化，反之亦然，改进的结构将允许进行更精确的测量；例如，如果只有一种手性的碳纳米管形成传感器，则可以以更高的精度确定应变或温度变化引起的效应。将特别注意在工作条件下测量传感器。进一步的实验方法将拓宽纳米表征的范围。其中包括亚纳米分辨率的扫描隧道显微镜（STM）和横向分辨率为1 m （-SE）的光谱椭偏仪。利用-SE可以确定经介质电泳沉积的CNTs的各向异性光学性质。相应的结果为光学特性的建模提供了输入。-SE也可以在传感器工作期间应用，以便测量光学特性的变化，例如由于应变引起的变化。此外，椭偏仪设置允许其他方法的实施，如拉曼光谱。为此，将对现有拉曼光谱仪的远程头进行修改，以便可以使用光谱椭偏仪和拉曼光谱以相当的横向分辨率研究相同的样品位置。这种组合对于功能化碳纳米管的研究尤其有趣，因为与纳米颗粒的功能化将显著改变其光学性质，并通过金属纳米颗粒在拉曼光谱中诱导SERS。最后，这种-SE和拉曼光谱的结合也将应用于卷起的智能管。在这里，光学性质可以监测作为一个功能的管填充与高横向分辨率。项目目标可以概括如下：应用和进一步优化在项目阶段开发的纳米表征方法，即TERS和c-AFM/KPFM，特别关注传感器操作期间的应用（原位分析）。集成STM作为扫描探针技术的进一步组成部分，用于纳米碳纳米管和基于它们的传感器/结构的纳米表征，分辨率低至亚纳米区域。利用-SE和拉曼光谱联合测定碳纳米管结构和智能管的各向异性光学特性。