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SBIR Phase I: Massively Dense 3D Integrated Memory

SBIR Phase I: Massively Dense 3D Integrated Memory
SBIR 第一阶段:高密度 3D 集成存储器
批准号:
1014317
负责人:
Burt Fowler
金额:
$15.0万
依托单位:
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2010
资助国家:
美国
项目状态:
已结题
起止时间:
2010-07-01 至 2010-12-31

项目摘要

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中文摘要
翻译
这个小企业创新研究第一阶段项目将进一步开发一种双端、电子可编程、非易失性存储器阵列,该阵列使用集成电路(IC)制造中常见的材料。每个元件都比单个晶体管小,并使用标准IC层形成。这导致三维集成存储器(3DIM)架构实现使用单一基板,而不需要连接多个芯片一起与先进的键合技术。这些器件的ON/OFF电导比和开关速度超过了竞争技术的性能。电流流经器件的纳米尺寸区域,因此,随着IC技术继续向更小的特征尺寸发展,每个器件将缩小尺寸,而不会减少通过器件的电流,从而产生具有信噪比的致密存储器阵列架构,这将为每个后续IC技术提供改进。拟议的整体计划将包括集成一个钝化层,用二极管连接每个元件,优化器件架构以最小化占地面积,并实现3DIM控制和驱动接口电子器件。本文提出的方案通过提供材料创新来改善电子产品的性能,其中纳米级半导体细丝是在商业数据存储应用的介电材料中制造的。该项目的更广泛的影响/商业潜力是在无线、手持、移动互联网和其他使用非易失性存储器的便携式设备的微电子芯片制造领域。具有双端、电子可编程电导率的材料可能会影响包括闪存和嵌入式存储器在内的许多商业市场,并将提供比当前可用的存储器技术更高数量级的数据存储密度。通过在单一衬底上实现大规模密集的3D存储阵列架构,无需制造两个衬底并将其粘合在一起,从而大大简化了制造工艺,降低了制造成本,提高了产品良率。由于外场导致误码和低信噪比的问题,或者由于器件运行基于热、离子传输或相变机制,这些机制本身就很慢,一些最近在单一衬底上实现3D存储器的方法并没有成功。拟议中的存储元件是用电信号而不是热能或化学能来控制的,这使得它们比竞争对手的技术效率更高,速度更快。除了便携式设备外,该3D设备还可以应用于天基地球科学和天文学,因为它可以耐受x射线和高能质子辐射。计划对其他类型的辐射进行额外的检测。
英文摘要
This Small Business Innovation Research Phase I project will further develop a two-terminal, electronically-programmable, nonvolatile memory array using materials commonly found in integrated circuit (IC) manufacturing. Each element is smaller than a single transistor and is formed using standard IC layers. This results in a three-dimensional integrated memory (3DIM) architecture achieved using a single substrate without the need for attaching multiple die together with advanced bonding techniques. The ON/OFF conductance ratio and switching speed of these devices exceed the performance of competing technologies. Current flows through nanometer-sized regions of the device, and, as a result, each device will scale to smaller dimensions as IC technology continues to progress towards smaller feature sizes without reducing the current through the device, thereby resulting in a dense memory array architecture with signal-to-noise ratio that will improve for each subsequent IC technology. The proposed overall program will include integrating a passivation layer, connecting each element with a diode, optimizing device architecture to minimize footprint, and implementing 3DIM control and drive interface electronics. The program proposed herein addresses the topic by providing material innovations for improved performance in electronics where nano-scale semiconducting filaments are fabricated within a dielectric material for commercial data storage applications.The broader impact/commercial potential of this project are in the areas of microelectronics chip manufacturing for wireless, hand-held, mobile internet and other portable devices using non-volatile memory. Materials exhibiting two-terminal, electronically-programmable conductance can potentially impact numerous commercial markets including flash and embedded memory, and will offer orders of magnitude more data storage density as currently-available memory technologies. By implementing massively dense 3D memory array architecture on a single substrate, there is no need to fabricate two substrates and bond them together, thereby greatly simplifying the fabrication process, reducing manufacturing cost and increasing product yield. Some recent approaches to achieve 3D memory on a single substrate have not been successful due to problems with external fields causing bit errors and low signal-to-noise ratio, or because device operation is based on thermal, ionic transport, or phase-change mechanisms that are inherently slow. The proposed memory elements are controlled using electrical signals rather than thermal or chemical energy, making them highly efficient and much faster than competing technologies. In addition to portable devices, the proposed 3D device may find applications in space-based earth sciences and astronomy since it is tolerant to x-ray and high-energy proton radiation. Additional testing in planned for other radiation types.
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SBIR Phase II: Massively Dense 3D Integrated Memory
  • 批准号:
    1127537
  • 项目类别:
    Standard Grant
  • 资助金额:
    $50.0万
  • 财政年份:
    2011
  • 负责人:
    Burt Fowler
  • 依托单位:
国内基金
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  • 项目类别:
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  • 资助金额:
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  • 批准号:
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  • 项目类别:
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  • 资助金额:
    3350万元
  • 批准年份:
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  • 负责人:
    刘衍文
  • 依托单位:
地幔含水相Phase E的温度压力稳定区域与晶体结构研究
  • 批准号:
    41802035
  • 项目类别:
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  • 资助金额:
    12.0万元
  • 批准年份:
    2018
  • 负责人:
    张里
  • 依托单位:
基于数字增强干涉的Phase-OTDR高灵敏度定量测量技术研究