SHF:Small:Collaborative Research: Algorithmic Techniques for Post-Silicon Characterization Using Infrared Emissions

SHF:Small：合作研究：使用红外发射进行硅后表征的算法技术

• 批准号: 1116858
• 负责人: Farinaz Koushanfar
• 金额: $ 20万
• 依托单位: William Marsh Rice University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2011
• 资助国家: 美国
• 起止时间: 2011-07-01 至 2015-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1116858&HistoricalAwards=false
• 关键词: SHF; Small; Collaborative; Research; Algorithmic

Aggressive technology scaling has brought new challenges to the design and manufacturing of Integrated Circuits (ICs). A mounting challenge is the modeling and characterization of power consumption in face of possible operating and manufacturing variabilities. Accurate power characterization leads to extended battery life for mobile devices and to enhanced device reliability. A second challenge arises because manufacturing is increasingly outsourced to external foundries. Verifying that the manufacturer has not inserted any malware or "Trojan" circuitry that compromises the security of the final product is essential. The proposed research provides a unifying framework for these two challenges by detailed algorithmic analysis of infrared emissions from the backside of ICs. We propose techniques to convert the infrared emissions into accurate spatial and temporal power estimates, and to use the power and infrared ?fingerprints? to verify that the chip does not contain extra circuits inserted by the manufacturer, unbeknownst to the designer, that could cause a security breach. The successful completion of this project will lead to improved power modeling and characterization tools and increased confidence that there are no added malware in manufactured chips. The project will also lead to design prototypes and a large volume of valuable data and benchmarks that will be openly disseminated via NSF-funded Trust-Hub and other web-based portals. The methods and tools will find broad usage in the industry, government, and in academia. They will also impact the daily lives by increasing the battery lifetime and by improving the system's reliability and integrity. Education plan includes research experience for undergraduates, curriculum development, integration of material into graduate courses and emphasizing entrepreneurship within education. Recruitment and development of under-represented groups of students will be targeted.

积极的技术扩展给集成电路（IC）的设计和制造带来了新的挑战。一个越来越大的挑战是面对可能的操作和制造可变性的功耗建模和表征。精确的功率表征导致移动的设备的电池寿命延长以及设备可靠性增强。第二个挑战出现了，因为制造业越来越多地外包给外部代工厂。确保制造商没有插入任何恶意软件或“特洛伊木马”电路，从而危及最终产品的安全性至关重要。拟议的研究通过对IC背面红外发射的详细算法分析，为这两个挑战提供了统一的框架。我们提出的技术转换成准确的空间和时间的功率估计的红外辐射，并使用功率和红外？指纹吗以验证芯片不包含制造商插入的额外电路，而设计者不知道，这可能会导致安全漏洞。该项目的成功完成将导致改进的功率建模和表征工具，并增加制造芯片中没有添加恶意软件的信心。该项目还将导致设计原型和大量有价值的数据和基准，这些数据和基准将通过NSF资助的Trust-Hub和其他基于网络的门户网站公开传播。这些方法和工具将在工业、政府和学术界得到广泛的使用。它们还将通过延长电池寿命和提高系统的可靠性和完整性来影响日常生活。教育计划包括本科生的研究经验，课程开发，将材料纳入研究生课程，并强调教育中的创业精神。将针对代表性不足的学生群体的招聘和发展。