Imaging charge transfer dynamics in nanomaterials using electron donor/acceptor modified AFM tips

使用电子供体/受体改进的 AFM 尖端对纳米材料中的电荷转移动力学进行成像

• 批准号: 1212907
• 负责人: Tianquan Lian
• 金额: $ 19.45万
• 依托单位: Emory University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2012
• 资助国家: 美国
• 起止时间: 2012-09-15 至 2014-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1212907&HistoricalAwards=false
• 关键词: Imaging; charge; transfer; dynamics; nanomaterials

In this award, funded by the Chemical Measurement and Imaging Program of the Division of Chemistry, Professor Tianquan Lian of Emory University and his postdoctoral, graduate and undergraduate student researchers will be supported to investigate the feasibility of imaging charge transfer dynamics in nanomaterials using specially modified atomic force microscopy (AFM) tips. Prof. Lian and his research group will attach quantum dots to the AFM tips and will measure the photoinduced charge transfer between the modified tip and the probed surface. The goal of this research is to develop a better understanding of the photophysical process taking place at the boundaries in nanomaterials used in solar energy conversion.Atomic force microscopy methods use contact between a nanometer-scale probe and a surface to measure the changes in morphology of the probed surface. The probe is able to measure differences in the physical properties (e.g. hardness, softness) of the underlying surface at the nanometer (or smaller) length scale. Prof. Lian and his group are attempting to build an AFM probe that will be able to do what the AFM does, except by measuring differences in the rate of photoinduced charge transfer between the modified probe tip and the underlying surface. The goal is to develop the ability to measure the photophysical/electrical properties of nanoscale materials with the same resolution that can be obtained with AFM methods. The students working on this project will gain useful experience in developing cutting-edge analytical spectroscopy tools that will be useful for evaluating and characterizing technologically useful materials. As part of this work, Prof. Lian will continue his exemplary efforts at encouraging students from underrepresented groups to pursue careers in the sciences.

在这个由化学系化学测量和成像计划资助的奖项中，埃默里大学的连天全教授及其博士后、研究生和本科生研究人员将获得支持，研究使用特殊改进的原子力显微镜(AFM)尖端对纳米材料中的电荷转移动力学进行成像的可行性。连教授和他的研究小组将把量子点连接到原子力显微镜尖端，并将测量修改后的尖端和被探测表面之间的光致电荷转移。这项研究的目的是更好地了解用于太阳能转换的纳米材料中发生在边界上的光物理过程。原子力显微镜方法利用纳米级探针与表面之间的接触来测量被探测表面的形貌变化。该探头能够在纳米(或更小)的长度尺度上测量下表面的物理属性(例如，硬度、柔软度)的差异。连教授和他的团队正在尝试建造一种原子力显微镜探头，它将能够做原子力显微镜所做的事情，除了通过测量修改后的探头尖端和下表面之间的光致电荷转移速率的差异。其目标是发展以与原子力显微镜方法相同的分辨率测量纳米材料的光物理/电学性质的能力。从事这个项目的学生将在开发尖端分析光谱分析工具方面获得有用的经验，这些工具将有助于评估和表征技术上有用的材料。作为这项工作的一部分，连教授将继续他的模范努力，鼓励来自代表性不足群体的学生在科学领域追求职业生涯。