Software Susceptibility-Driven Non-Uniform Memory Error Protection

软件敏感性驱动的非一致内存错误保护

• 批准号: 1255729
• 负责人: Michael Huang
• 金额: $ 20.7万
• 依托单位: University of Rochester
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 2013
• 资助国家: 美国
• 起止时间: 2013-04-01 至 2017-03-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1255729&HistoricalAwards=false
• 关键词: Software; Susceptibility; Driven; Non; Uniform

A memory device may exhibit errors due to manufacturing defects, device aging, or particle strikes from cosmic-ray-induced neutrons. Memory errors are an important threat to computer system reliability as semiconductor technologies continue to scale. This project develops a new approach that protects against memory errors non-uniformly by exploiting unequal error susceptibility at different memory regions in a computer system. Collaboration with industry researchers facilitates the integration of developed techniques into real-world memory technologies. Results of this project will contribute to comprehensive computer system reliability that is critical to society and the health of the world's economy. Curriculum enhancement and student training in this project enable advanced human resource development that is necessary for today's and tomorrow's digital workforce.Research and development efforts within this project include four synergistic components: First, this project introduces a new software approach that systematically uncovers important characteristics of memory error propagation and its consequences. Second, research develops new energy-efficient hardware support for flexible, dynamic adjustment of memory error protection on each memory area. Third, this project devises non-uniform memory error protection policies that optimize for reliability and efficiency based on software error susceptibility and hardware protection costs. Finally, the developed error susceptibility assessment and non-uniform protection techniques are evaluated using real application scenarios. Cross-layer (software/hardware) technologies developed in this project enable wide utilization of advanced memory reliability mechanisms without significant loss of performance or energy efficiency.

由于制造缺陷，设备老化或宇宙射线诱导的中子的颗粒罢工，内存设备可能会出现错误。随着半导体技术继续扩展，内存错误是对计算机系统可靠性的重要威胁。该项目开发了一种新方法，该方法通过利用计算机系统不同内存区域的不等误差敏感性来防止内存错误。与行业研究人员的合作促进了开发技术与现实记忆技术的集成。该项目的结果将有助于全面的计算机系统可靠性，这对社会和世界经济的健康至关重要。该项目中的课程增强和学生培训使当今和明天的数字劳动力所必需的先进的人力资源开发。该项目中的研究和开发工作包括四个协同组件：首先，该项目介绍了一种新的软件方法，该方法系统地介绍了一种记忆误差及其后果的重要特征。其次，研究开发了新的节能硬件支持，以在每个内存区域对灵活的，动态的内存错误保护。第三，该项目设计了基于软件错误易感性和硬件保护成本的可靠性和效率的非均匀内存错误保护策略。最后，使用实际应用方案评估了开发的错误敏感性评估和不均匀的保护技术。该项目中开发的跨层（软件/硬件）技术可以广泛利用高级内存可靠性机制，而不会大大损失性能或能源效率。