On-Chip Diagnosis for Aging and Early-Life Failure Detection

用于老化和早期故障检测的片上诊断

• 批准号: 1255804
• 负责人: Ronald Blanton
• 金额: $ 19.2万
• 依托单位: Carnegie-Mellon University
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 2013
• 资助国家: 美国
• 起止时间: 2013-04-01 至 2018-03-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1255804&HistoricalAwards=false
• 关键词: Chip; Diagnosis; Aging; Early; Life

Despite the best efforts of the semiconductor industry, integrated electronic systems are not inherently robust because they are "born" (manufactured) with a unique "personality" that stems from the industry's inability to precisely fabricate their underlying circuits, and to write software that controls the resulting uncertainty. An integrated system personality is further shaped by its environment (e.g., temperature, noise, etc.) and usage (i.e., the frequency and type of applications executed), and since both can fluctuate over time, so can the system personality. Systems also "grow old" and degrade predictably due to various wear-out mechanisms but also unexpectedly due to early-life failure sources. These "nature and nurture" influences make it extremely difficult to design a robust integrated system that will operate optimally for all possible personalities. This research achieves integrated-system robustness by judiciously testing and diagnosing the system for any faults through the development of a generalized, scalable on-chip circuitry that tests and diagnoses any system without significant power and performance penalty. Success of this research effort will help ensure that integrated-system manufacturers can produce robust systems, in the most cost-effective manner, despite the large number and variety of failure sources that negatively impact system reliability. Also, our need for continued development of STEM (science, technology, engineering and mathematics) education in under-represented groups will be aided by this effort via involvement of a diverse group of graduate and undergraduate researchers.

尽管半导体行业做出了最大的努力，但集成电子系统并不具有固有的鲁棒性，因为它们“出生”（制造）具有独特的“个性”，这源于该行业无法精确制造其底层电路，并且无法编写控制所产生的不确定性的软件。集成系统个性进一步由其环境塑造（例如，温度、噪声等）和使用（即，执行的应用程序的频率和类型），并且由于两者都可以随时间波动，所以系统个性也可以。 由于各种磨损机制，系统也会“变老”并可预测地退化，但也会由于早期寿命故障源而意外地退化。这些“先天和后天”的影响使得设计一个强大的综合系统，使其对所有可能的个性都能最佳地运作变得极其困难。本研究通过开发一种通用的、可扩展的片上电路来测试和诊断任何系统，而不需要显著的功耗和性能损失，从而明智地测试和诊断系统的任何故障，从而实现集成系统的鲁棒性。这项研究工作的成功将有助于确保集成系统制造商能够以最具成本效益的方式生产强大的系统，尽管大量和各种各样的故障源会对系统可靠性产生负面影响。此外，我们需要在代表性不足的群体中继续发展STEM（科学，技术，工程和数学）教育，这将有助于通过研究生和本科生研究人员的多元化群体的参与。