SHF:Small:Test Data Learning for Ultra High Dignostic Resolution

SHF：小：超高诊断分辨率的测试数据学习

• 批准号: 1218576
• 负责人: Ronald Blanton
• 金额: $ 45万
• 依托单位: Carnegie-Mellon University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2012
• 资助国家: 美国
• 起止时间: 2012-07-01 至 2017-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1218576&HistoricalAwards=false
• 关键词: SHF; Small; Test; Data; Learning

Integrated circuits (ICs) are pervasive in all aspects of our lives, used in everything from computers to mobile phones to automobiles. However, fabricating ICs that both work and are reliable is becoming extremely difficult due to the significant complexity inherent in the underlying fabrication processes. It is therefore extremely important to understand the reasons why some ICs fail to operate properly. In this NSF project, new methodologies for locating and characterizing the root cause for IC failure will be developed. Existing approaches typically produce uncertain results because they rely on limited information about the IC design. In this work, additional design information and data extracted from other failing ICs will be holistically used to efficiently derive the reason for IC failure from data measured from failing ICs. Efficiently discovering the root-cause of failure for an IC will enable the design, the fabrication and even the testing of ICs to be significantly improved, helping to ensure the continued advancement of the electronics industry.The principal investigator (PI) is committed to having a broader impact through training a diverse group of undergraduate and graduate researchers. His research group has members from under-represented groups that include women, African Americans, Hispanic Americans, and Native Americans. In addition, as director of the Center for the Silicon System Implementation (CSSI) at Carnegie Mellon University, the PI manages a program that recruits undergrads researchers from various universities (including minority-serving institutions), and the annual convention of the National Society of Black Engineers. This program has been very successful, resulting in the recruitment of many undergraduate researchers, including both women and African-Americans. In the last few years, the PI himself has supervised nine undergraduate researchers, three of which were African-American (two male and one female). In addition, the preliminary work undertaken by this NSF contract is now published and was actually accomplished by one of our African-American researchers. The PI will continue to recruit a diverse group of students, both at the graduate and undergraduate levels, for participation in this project.

集成电路（IC）在我们生活的各个方面都很普遍，从计算机到移动的电话再到汽车，都在使用集成电路。然而，由于底层制造工艺中固有的显著复杂性，制造既工作又可靠的IC变得极其困难。因此，了解某些IC无法正常工作的原因非常重要。在这个NSF项目中，将开发用于定位和表征IC故障根本原因的新方法。现有的方法通常会产生不确定的结果，因为它们依赖于有限的信息的IC设计。在这项工作中，额外的设计信息和从其他失败的IC中提取的数据将被全面用于有效地从失败的IC测量的数据中得出IC故障的原因。有效地发现IC故障的根本原因将使IC的设计、制造甚至测试得到显著改善，有助于确保电子行业的持续发展。首席研究员（PI）致力于通过培养多样化的本科生和研究生研究人员群体产生更广泛的影响。他的研究小组成员来自代表性不足的群体，包括妇女、非洲裔美国人、西班牙裔美国人和美洲原住民。 此外，作为卡内基梅隆大学硅系统实施中心（CSSI）的主任，PI管理着一个从各个大学（包括少数民族服务机构）招募本科生研究人员的计划，以及全国黑人工程师协会的年度大会。该计划非常成功，招募了许多本科研究人员，包括女性和非洲裔美国人。在过去的几年里，PI自己监督了9名本科生研究人员，其中3名是非洲裔美国人（2男1女）。此外，由NSF合同进行的初步工作现在已经出版，实际上是由我们的一位非洲裔美国研究人员完成的。PI将继续招募不同群体的学生，无论是在研究生和本科生水平，参与这个项目。