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Ge/Si quantum dots in the sub 20nm regime - exact positioning and electrical functionalisation

Ge/Si quantum dots in the sub 20nm regime - exact positioning and electrical functionalisation
亚 20nm 范围内的 Ge/Si 量子点 - 精确定位和电功能化
批准号:
21685746
负责人:
Professor Dr. Harald Giessen
金额:
$0.0万
依托单位国家:
德国
项目类别:
Research Units
财政年份:
2006
资助国家:
德国
项目状态:
已结题
起止时间:
2005-12-31 至 2012-12-31
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中文摘要
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英文摘要
The goal of this project is to implement SiGe/Si devices on single positioned quantum dots, to test the electrical functions in competition to more classical approaches, and to fabricate the structures as part of integrated mm-wave circuits. Silicon-based systems are of high importance in microelectronics, but additionally this material system can be considered as a model system for strain adjustment and band alignment in indirect semiconductor couples. The devices and circuits proposed include mm-wave rectifying antenna, oscillators, interband tunneling diodes and strained channel field effect transistors (FET). The concept of DotFET s where the strain field is created by the Ge dot needs strongly positioned islands to be feasible. The positioning is driven by the self-assembled growth of Ge islands on pre-patterned surfaces and by the adjustment of proper strain distribution around the islands with so-called virtual substrates.
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