MRI: Acquisition of a Shared Atomic Force Microscope System

马里兰大学帕克分校的王玉煌教授及其同事Janice Reutt-Robey、Lawrence Sita、王春生和胡良兵获得了来自主要研究仪器（MRI）和化学研究基础设施和设施项目的奖项。在AFM中，激光束通过悬臂和尖端被引导到表面。当悬臂梁与表面相互作用而发生位移时，激光束的反射就会显示在探测器（光电二极管）上。通过这种方式，借助于电子系统就可以产生表面的图像。一般来说，AFM有三个主要功能：力测量、成像和操作。显微镜是研究材料表面的重要工具。它用于基础和应用研究，研究表面的形态学、表面成像和功能化、表面的电、磁、化学和机械性能。这些知识使得在纳米科学和能源科学等领域开发更好的材料取得进展。该仪器用于本科生和研究生的研究和培训，为他们的技术职业和接受高等教育的机会做好准备。该建议旨在加强各级的研究和教育，特别是在：(a)研究纳米颗粒在模型界面上的输运和内化，(b)探测低维碳材料中的量子缺陷，(c)绘制纳米碳颗粒在聚氯乙烯中的峰值电流和峰值力，(d)在玻璃上成像小电路，(e)研究精密聚烯烃的活性聚合和直接组装，(f)评估铝石膜的完整性和稳定性，(g)理解和定制纳米硅电极的固相界面设计；(h)研究二硫化钼的固相界面形成、结构和演化。

With this award from the Major Research Instrumentation (MRI) and Chemistry Research Infrastructure and Facilities programs, Professor YuHuang Wang from the University of Maryland College Park and colleagues Janice Reutt-Robey, Lawrence Sita, Chunsheng Wang and Liangbing Hu have acquired an atomic force microscope system. In an AFM a laser beam is directed to a surface by means of a cantilever and tip. As the cantilever is displaced by interacting with the surface, a reflection of the laser beam is displayed on a detector (photodiode). In this way an image of the surface can be created with the aid of an electronic system. In general, an AFM has three major abilities: force measurement, imaging, and manipulation. The microscope is an important tool in the investigation of the surfaces of materials. It is used in fundamental and applied research to study morphology of surfaces, surface imaging and functionalization, electrical, magnetic, chemical and mechanical properties of surfaces. This knowledge enables advances in developing better materials in fields such as nanoscience and energy science. The instrument is used in the research and training of undergraduate and graduate students preparing them for technical careers and opportunities for advanced education. The proposal is aimed at enhancing research and education at all levels, especially in: (a) studying nanoparticle transport and internalization at model interfaces, (b) probing quantum defects in low-dimensional carbon materials, (c) mapping peak current and peak force of carbon nanoparticles in covetics, (d) imaging small circuits on glass, (e) studying living polymerization and direct assembly of precision polyolefins, (f) assessing the integrity and stability of xeolite membranes, (g) understanding and tailoring designing of solid state interphases for nanostructured silicon electrodes and (h) studying solid electrode interface formation, structure and evolution of molybdenum disulfide.