EAGER: Ultra-High-Performance Terahertz Detection Exploiting Super-Steep-Subthreshold-Slope (S4)-FinFETs
EAGER: Ultra-High-Performance Terahertz Detection Exploiting Super-Steep-Subthreshold-Slope (S4)-FinFETs
批准号:
1644592
负责人:
Pierre-Emmanuel Gaillardon
金额:
$15.0万
依托单位:
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2016
资助国家:
美国
项目状态:
已结题
起止时间:
2016-08-15 至 2018-07-31
中文摘要
在过去的几十年中,太赫兹频率范围(0.1-30 THz)由于其在天文学、成像、光谱学、通信等领域的广泛应用而成为备受关注的主题,尽管最近取得了重大进展,但仍然需要在这些频率下有效工作的半导体器件。该项目将在短时间内为太赫兹社区的一个长期问题提供答案:如何在室温下实现非常灵敏的太赫兹检测,该检测是在工厂友好的,大规模可制造的固态设备中实现的。为了实现这一目标,所提出的工作旨在利用超陡亚阈值斜率鳍基场效应晶体管作为高效的太赫兹探测器。该项目将是第一个对这种新兴晶体管技术的太赫兹应用进行研究的项目,预计将在未来几年改变太赫兹技术的格局。事实上,期望在太赫兹检测中提供超过两个数量级的性能增益,这是太赫兹社区的巨大兴趣。更一般地,收获新兴晶体管技术的独特性质用于可行的现实世界应用也是半导体器件社区的高度兴趣。这一研究愿景与指导电子设备,高频电子,模拟电路,太赫兹和光学领域的新一代研究生和本科生的强烈教育目标交织在一起,通过为他们提供实践经验来激发他们的批判性思维和好奇心。鉴于美国未来对训练有素的工程师和科学家的需求,这一点非常重要。本项目旨在利用基于超陡亚阈值斜率鳍片的场效应晶体管作为高效的太赫兹探测器。在这些器件中实现非常灵敏的太赫兹响应的基本机制是它们的超陡亚阈值斜率(10 mV/dec.),这是由弱碰撞电离引起的正反馈的结果,并且可以导致非常大的响应度。基于所制造器件的测量直流特性的初步数据预测,相对于所有现有的当前室温太赫兹检测器技术,在响应度以及噪声等效功率方面都有更好的性能,即,噪声等效功率约为0.01 pW/(Hz^0.5)。超陡斜率场效应晶体管将被制造和配置为超高性能的太赫兹探测器。由于其超陡斜率响应,该技术可以保证比室温FET和肖特基二极管太赫兹探测器的热限制10 A/W响应度大两个数量级以上的响应度,而不会增加成本。这种性能水平是常规CMOS技术无法实现的。此外,与其他有前途的后CMOS晶体管技术相比,(例如隧道FET),这些器件构成了更稳健的平台,因为:(a)已经演示了根据太赫兹探测器要求的具有直流性能的超陡斜率场效应晶体管的室温演示,(B)超陡斜率场效应晶体管是基于硅的并且与CMOS工艺100%兼容。
英文摘要
Over the past decades, the terahertz frequency regime (0.1-30 THz) has become the subject of much attention due to its wide range of applications in diverse areas such as astronomy, imaging, spectroscopy, communications, and so on. Although significant progress has been recently achieved, there is still a need for semiconductor devices efficiently operating at these frequencies. This project will provide in a short-timeframe an answer for a long-standing problem of the terahertz community: How to achieve very sensitive terahertz detection in foundry-friendly, large-scale manufacturable, solid-state devices at room temperature. To achieve this goal, the proposed work aims to exploit Super-Steep-Subthreshold-Slope Fin-based Field Effect Transistors as efficient terahertz detectors. This project will be the first to perform research on terahertz applications of this emerging transistor technology and is expected to transform the terahertz technology landscape in the coming years. Indeed, the expectation is to provide more than two orders of performance gain in terahertz detection, which is of immense interest to the terahertz community. More generally, harvesting the unique properties of emerging transistor technologies for viable real-world applications is also of high interest to the semiconductor device community. This research vision is interlaced with the strong educational objective of mentoring new generations of graduate and undergraduate students in the field of electron devices, high frequency electronics, analog circuits, terahertz, and optics, stimulating their critical thinking and curiosity by providing them with hands-on experience in cutting-edge research. This is of significant importance given the future projected needs for highly trained engineers and scientists in the United States.This project aims at exploiting Super-Steep-Subthreshold-Slope Fin-based Field Effect Transistors as efficient terahertz detectors. The fundamental mechanism enabling a very sensitive terahertz response in these devices is their super-steep subthreshold slope (10mV/dec.), which is a result of a positive feedback induced by weak impact ionization and can lead to a very large responsivity. Preliminary data based on the measured direct current characteristics of fabricated devices predicts a much better performance in terms of both responsivity as well as noise equivalent power with respect to all the existing current room-temperature terahertz detector technologies, i.e., noise equivalent power ~ 0.01 pW/(Hz^0.5). Super-steep-slope Field Effect Transistors will be fabricated and configured as ultra-high-performance terahertz detectors. Thanks to its super-steep-slope response, this technology can promise more than two orders of magnitude larger responsivity than the thermally-limited 10 A/W responsivity of room-temperature FET and Schottky diode terahertz detectors, without increase in cost. This level of performance is not achievable with regular CMOS technologies. Moreover, when compared with other promising post-CMOS transistor technologies as terahertz detectors (such as tunnel FETs), these devices constitute a more robust platform since: (a) room-temperature demonstrations of super-steep-slope field effect transistors with direct current performance according to the requirements of terahertz detectors have been already demonstrated, (b) super-steep-slope field effect transistors are silicon based and 100% compatible with CMOS processes.
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Low-Temperature Wet Conformal Nickel Silicide Deposition for Transistor Technology through an Organometallic Approach
通过有机金属方法进行晶体管技术的低温湿法保形硅化镍沉积
DOI:
10.1021/acsami.6b13852
发表时间:
2017
期刊:
ACS Applied Materials & Interfaces
影响因子:
9.5
作者:
[Lin, Tsung-Han, Margossian, Tigran, De Marchi, Michele, Thammasack, Maxime, Zemlyanov, Dmitry, Kumar, Sudhir, Jagielski, Jakub, Zheng, Li-Qing, Shih, Chih-Jen, Zenobi, Renato]
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Zenobi, Renato
A Continuous Compact DC Model for Dual-Independent-Gate FinFETs
双独立栅极 FinFET 的连续紧凑 DC 模型
DOI:
10.1109/jeds.2016.2632709
发表时间:
2017
期刊:
IEEE Journal of the Electron Devices Society
影响因子:
2.3
作者:
[Hasan, Mehdi, Gaillardon, Pierre-Emmanuel, Sensale-Rodriguez, Berardi]
通讯作者:
Sensale-Rodriguez, Berardi
Towards high-performance polarity-controllable FETs with 2D materials
采用 2D 材料实现高性能极性可控 FET
DOI:
10.23919/date.2018.8342088
发表时间:
2018
期刊:
Automation & Test in Europe Conference & Exhibition (DATE
影响因子:
--
作者:
[Resta, Giovanni V., Gonzalez, Jorge Romero, Balaji, Yashwanth, Agarwal, Tarun, Lin, Dennis, Catthor, Francky, Radu, Iuliana P., De Micheli, Giovanni, Gaillardon, Pierre-Emmanuel]
通讯作者:
Gaillardon, Pierre-Emmanuel
Operation regimes and electrical transport of steep slope Schottky Si-FinFETS
陡坡肖特基 Si-FinFET 的工作状态和电传输
DOI:
10.1063/1.4975475
发表时间:
2017
期刊:
Journal of Applied Physics
影响因子:
3.2
作者:
[D.-Y. Jeon, J. Zhang, J. Trommer, S.-J. Park, P.-E. Gaillardon, G. De Micheli, T. Mikolajick, W. M. Weber]
通讯作者:
W. M. Weber
Polarity-controllable 2-dimensional transistors: experimental demonstration and scaling opportunities
极性可控的二维晶体管:实验演示和扩展机会
DOI:
--
发表时间:
2017
期刊:
The 17th IEEE International Conference on Nanotechnology (IEEE NANO 2017
影响因子:
--
作者:
[Resta, Giovanni V., Balaji, Yashwanth, Agarwal, Tarun, Radu, Iuliana P., Lin, Dennis, Catthoor, Francky, Gaillardon, Pierre-Emmanuel, De Micheli, Giovanni]
通讯作者:
De Micheli, Giovanni
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批准号:1856740
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负责人:Pierre-Emmanuel Gaillardon
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