MRI: Acquisition of a High Resolution Photon Emission/Electro-Optical Microscope for Non-invasive Evaluation of Electronic Devices and Systems Security

MRI：获取高分辨率光子发射/光电显微镜，用于电子设备和系统安全的非侵入性评估

• 批准号: 1726716
• 负责人: Mark Tehranipoor
• 金额: $ 99.98万
• 依托单位: University of Florida
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2017
• 资助国家: 美国
• 起止时间: 2017-10-01 至 2020-09-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1726716&HistoricalAwards=false
• 关键词: MRI; Acquisition; Resolution; Photon; Emission

This project, acquiring a new high resolution microscope, aims to allow users to analyze the performance of electronic devices and systems. With a user friendly interface and the use of intuition, the instrument is expected to maximize its accessibility for on-site use and for off campus users. The platform will be used for teaching, education, and outreach. This effort is shared by six universities in Florida. The effort enables:- Remote access capability to reach over 500 students every year both on and off campus; - Material and expertise on hardware security related topics for educators to incorporate in their classroom curricula;- Help to bring experts into their classrooms to discuss real-world applications; and - Exposure of undergraduates to advanced microscopy techniques. This new high resolution photon emission and electro-optical microscope enables the analysis by visualizing the transistor functionality non-destructively. When analyzing performance in this fashion, maximum impact is gained from multiple features such as: - New high sensitive detectors that enable high resolution; - Laser scanning configuration that enable static and dynamic failure analysis; - Static laser scanning stimulation that contribute to identify the source of shorts and resistive defects; and - Electro-optical probing and frequency mapping that enable rapid identification of regions of interest. The unique capabilities of the instrument constitute a critical enabling parameter for research in hardware and system security areas. These include:- Counterfeit detection by providing more detailed data than general electrical tests in less expensive and non-destructive manner; - Semi-invasive physical attacks by enabling advanced contactless probing techniques and laser injection to measure circuit activity; - Trojan detection by performing trust analysis of fabricated integrated circuits for validation of security and trust; and- Reverse and anti-reverse engineering by complementing conventional reverse engineering and extracting the intellectual property blocks critic information.

该项目获得了一种新的高分辨率显微镜，旨在让用户分析电子设备和系统的性能。该仪器具有用户友好的界面和直观性，预计将最大限度地方便现场和校外用户使用。该平台将用于教学、教育和推广。这项工作由佛罗里达的六所大学共同承担。这项工作使：-远程访问能力，以达到500多名学生，每年都在校园内外; -材料和专业知识的硬件安全相关的主题，为教育工作者纳入他们的课堂课程;-帮助把专家到他们的教室，讨论现实世界的应用;和-本科生接触先进的显微技术。这种新的高分辨率光子发射和电光显微镜能够通过非破坏性地观察晶体管功能来进行分析。当以这种方式分析性能时，可以从多个功能中获得最大的影响，例如：-实现高分辨率的新型高灵敏度探测器; -实现静态和动态故障分析的激光扫描配置; -有助于识别短路和电阻性缺陷来源的静态激光扫描刺激;以及-电光探测和频率映射，能够快速识别感兴趣的区域。该仪器的独特能力构成了硬件和系统安全领域研究的关键使能参数。这些措施包括：-以较便宜和非破坏性的方式提供比一般电气测试更详细的数据，从而进行假冒检测; -利用先进的非接触式探测技术和激光注入来测量电路活动，从而进行半侵入式物理攻击; -对制造的集成电路进行信任分析，以验证安全性和信任，从而进行木马检测;以及-通过补充传统的反向工程和提取知识产权块批评信息来进行反向和反反向工程。