MRI: Acquisition of a High Resolution Photon Emission/Electro-Optical Microscope for Non-invasive Evaluation of Electronic Devices and Systems Security

MRI：获取高分辨率光子发射/光电显微镜，用于电子设备和系统安全的非侵入性评估

• 批准号: 1726716
• 负责人: Mark Tehranipoor
• 金额: $ 99.98万
• 依托单位: University of Florida
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2017
• 资助国家: 美国
• 起止时间: 2017-10-01 至 2020-09-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1726716&HistoricalAwards=false
• 关键词: MRI; Acquisition; Resolution; Photon; Emission

This project, acquiring a new high resolution microscope, aims to allow users to analyze the performance of electronic devices and systems. With a user friendly interface and the use of intuition, the instrument is expected to maximize its accessibility for on-site use and for off campus users. The platform will be used for teaching, education, and outreach. This effort is shared by six universities in Florida. The effort enables:- Remote access capability to reach over 500 students every year both on and off campus; - Material and expertise on hardware security related topics for educators to incorporate in their classroom curricula;- Help to bring experts into their classrooms to discuss real-world applications; and - Exposure of undergraduates to advanced microscopy techniques. This new high resolution photon emission and electro-optical microscope enables the analysis by visualizing the transistor functionality non-destructively. When analyzing performance in this fashion, maximum impact is gained from multiple features such as: - New high sensitive detectors that enable high resolution; - Laser scanning configuration that enable static and dynamic failure analysis; - Static laser scanning stimulation that contribute to identify the source of shorts and resistive defects; and - Electro-optical probing and frequency mapping that enable rapid identification of regions of interest. The unique capabilities of the instrument constitute a critical enabling parameter for research in hardware and system security areas. These include:- Counterfeit detection by providing more detailed data than general electrical tests in less expensive and non-destructive manner; - Semi-invasive physical attacks by enabling advanced contactless probing techniques and laser injection to measure circuit activity; - Trojan detection by performing trust analysis of fabricated integrated circuits for validation of security and trust; and- Reverse and anti-reverse engineering by complementing conventional reverse engineering and extracting the intellectual property blocks critic information.

该项目获得了新的高分辨率显微镜，旨在允许用户分析电子设备和系统的性能。借助用户友好的接口和直觉的使用，该仪器有望最大程度地提高其现场使用和校园用户的可访问性。该平台将用于教学，教育和外展。佛罗里达州的六所大学分享了这一努力。这项工作使： - 远程访问能力每年在校园内外都可以吸引500多名学生； - 有关硬件安全与教育工作者的材料和专业知识，以供教育工作者纳入课堂课程； - 帮助将专家带入教室，讨论现实世界的应用程序； - 在高级显微镜技术中暴露于本科生。这种新的高分辨率光子发射和电流显微镜可以通过非破坏性地可视化晶体管功能来实现分析。在以这种方式分析性能时，从多个功能（例如： - 新的高敏感探测器）产生了最大影响； - 激光扫描配置，可以实现静态和动态故障分析； - 静态激光扫描刺激有助于确定短裤和电阻缺陷的来源； - - 电源探测和频率映射，可以快速识别目标区域。该仪器的独特功能构成了硬件和系统安全区域研究的关键促进参数。其中包括： - 通过以较便宜和无损的方式提供比一般电气测试更多的详细数据来伪造检测； - 通过启用高级非接触式探测技术和激光注射来测量电路活动的半侵入性物理攻击； - 特洛伊木马检测通过对制造的集成电路进行信任分析以验证安全和信任；以及通过补充常规逆向工程并提取知识产权的逆向和反向工程，阻止了评论家信息。