PFI-RP: Measurement system for high speed and precision manufacturing

PFI-RP：用于高速精密制造的测量系统

• 批准号: 1918260
• 负责人: Rongguang Liang
• 金额: $ 55万
• 依托单位: University of Arizona
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2019
• 资助国家: 美国
• 起止时间: 2019-07-01 至 2023-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1918260&HistoricalAwards=false
• 关键词: PFI; RP; Measurement; system; speed

The broader impact/commercial potential of this Partnerships for Innovation-Research Partnerships (PFI-RP) project is the development and commercialization of an on-machine measurement (also called metrology) system that can increase the economic competitiveness of the United States in precision manufacturing, or the ability to machine complex components and parts with low margins for error. This project will enhance the ability to efficiently machine highly engineered parts, solving a common costly and labor-intensive technical hurdle facing many industries including optics, additive or 3D manufacturing, and other sectors with highly demanding machining requirements. This project will also create new and broader collaborations with industry, enhance partnerships between academia and industry, and build infrastructure for research and education. The proposed activities will provide next generation leaders in innovation and entrepreneurship with firsthand experience in technology development, translation, and commercialization. In addition, this work will expand the participation of women and students from underrepresented groups in innovation, technology translation, and entrepreneurship. The proposed project is expected to advance high-throughput precision manufacturing. Currently the key technical bottleneck in diamond turning and other high-precision fabrication is the metrology process used for quality control. Existing practices to center a tool and to ensure the quality of the fabricated workpiece are very time-consuming, requiring several iterations to remove the workpiece from the machine for offline measurements and then to remount workpiece onto the machine. The removal and remount processes often introduce additional manufacturing errors. The proposed compact, snapshot, dual-mode, multi-wavelength interferometric system will incorporate several unique techniques to significantly improve speed and manufacturing accuracy. Specifically, a polarization-based multi-wavelength snapshot technique will enable the real-time measurement of machined surfaces with minimum environmental impact. A deep-learning-based phase unwrapping technique will eliminate the time-consuming phase unwrapping problem in interferometric measurement. The unique configuration ensures a very compact interferometric system that can be integrated seamlessly into existing equipment for in-situ metrology. The new fabrication process with real-time, in-situ metrology is estimated to improve efficiency by 30% or greater in tool alignment, and another 50% or greater in surface metrology.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.

这一创新研究伙伴关系(PFI-RP)项目的更广泛影响/商业潜力是开发一种机器测量(也称为计量学)系统并将其商业化，该系统可以提高美国在精密制造领域的经济竞争力，或以低误差容错率加工复杂零部件的能力。该项目将提高高效加工高工程化零件的能力，解决许多行业面临的常见的昂贵且劳动密集型的技术障碍，包括光学、添加剂或3D制造以及其他加工要求高的行业。该项目还将与工业界建立新的更广泛的合作，加强学术界和工业界之间的伙伴关系，并为研究和教育建设基础设施。拟议的活动将为创新和创业领域的下一代领导者提供技术开发、翻译和商业化方面的第一手经验。此外，这项工作将扩大妇女和代表不足群体的学生在创新、技术转化和创业方面的参与。拟议中的项目预计将推进高产能精密制造。目前，钻石车削和其他高精度加工的关键技术瓶颈是用于质量控制的计量过程。现有的将刀具对中并确保所制造的工件质量的做法非常耗时，需要多次迭代才能将工件从机器上取出以进行离线测量，然后将工件重新安装到机器上。拆卸和重新安装过程通常会带来额外的制造误差。拟议的紧凑型、快照、双模、多波长干涉系统将采用几种独特的技术，以显著提高速度和制造精度。具体地说，基于偏振的多波长快照技术将能够以最小的环境影响对加工表面进行实时测量。基于深度学习的相位展开技术将消除干涉测量中耗时的相位展开问题。独特的配置确保了一个非常紧凑的干涉系统，可以无缝地集成到现有的现场测量设备中。具有实时、现场测量的新制造工艺估计将使工具对准效率提高30%或更多，表面测量效率提高50%或更多。该奖项反映了NSF的法定使命，并通过使用基金会的智力优势和更广泛的影响审查标准进行评估，被认为值得支持。

项目成果

Generalized elliptical retarder design and construction using nematic and cholesteric phase liquid crystal polymers

使用向列相和胆甾相液晶聚合物的广义椭圆延迟器设计和构造

• DOI: 10.1364/oe.456874
• 发表时间: 2022
• 期刊: Optics Express
• 影响因子: 3.8
• 作者: Miller, Sawyer;Jiang, Linan;Pau, Stanley
• 通讯作者: Pau, Stanley

Patterned liquid crystal polymer C-plate retarder and color polarizer

图案化液晶聚合物C板延迟片和彩色偏光片

• DOI: 10.1364/ao.416845
• 发表时间: 2021
• 期刊: Applied optics
• 影响因子: 1.9
• 作者: Sawyer Miller, Linan Jiang

Compact snapshot multiwavelength interferometer

紧凑型快照多波长干涉仪

• DOI: 10.1364/ol.44.004463
• 发表时间: 2019-09-15
• 期刊: OPTICS LETTERS
• 影响因子: 3.6
• 作者: Wang, Daodang;Tian, Xiaobo;Liang, Rongguang
• 通讯作者: Liang, Rongguang

Compact snapshot dual-mode interferometric system for on-machine measurement

用于机上测量的紧凑型快照双模干涉系统

• DOI: 10.1016/j.optlaseng.2020.106129
• 发表时间: 2020
• 期刊: Optics and Lasers in Engineering
• 影响因子: 4.6
• 作者: Wang Daodang;Fu Xiangyu;Xu Ping;Tian Xiaobo;Spires Oliver;Liang Jian;Wu Heng;Liang Rongguang
• 通讯作者: Liang Rongguang

On-axis deflectometric system for freeform surface measurement

用于自由曲面测量的同轴偏转系统

• DOI: 10.1364/ol.486170
• 发表时间: 2023
• 期刊: Optics Letters
• 影响因子: 3.6
• 作者: Zhu, Shengtai;Wang, Daodang;Kang, Wenjun;Liang, Rongguang
• 通讯作者: Liang, Rongguang