RUI: Development of Next-Generation Drift-Time Ion Mobility Spectrometry through the Application of Pulsed Ionization and Voltage Sweep Methodologies

在化学部化学测量和成像计划的支持下，Whitworth大学的Eric Davis和他的团队正在努力提高离子迁移谱（IMS）的能力，这是一种通常用于安全和军事应用的化学测量技术，用于检测爆炸物，麻醉品和化学战剂。戴维斯小组试图通过提高IMS快速分离复杂的真实世界混合物的能力来扩大IMS的实用性。这项研究主要是由惠特沃思大学的本科生戴维斯教授的监督下进行。 通过与Brian H.在华盛顿州立大学，戴维斯博士的学生接触到研究生院的环境，帮助他们更好地准备攻读研究生。研究机会也扩大到分析化学家在更大的斯波坎，WA地区的当地社区，汇集了工业和学术化学家为学生和community.Prior的共同利益的努力，在创建电压扫描（VS）IMS分离利用阶跃电位或多路复用VS方法，不达到高分辨率或高速分离所需的许多IMS应用。利用基于印刷电路板的IMS单元（具有最小的电路迹线以减小电容）和应用高压放大器（能够具有500 V/ms转换速率）实现了单次运行VSIMS方法，该方法可以提供IMS分辨率和峰值容量的显著改进。在低场条件下通过选通过程的离子的寄生损失可以通过使用脉冲电离源和消除离子门来减轻。主要目的是（1）开发一种使用高压放大器的单次运行VSIMS方法，以实现高分辨率、高峰容量的IMS分离;（2）评估脉冲电离源与IMS和质谱（MS）在离子形成、动力学和形态方面的效用;以及（3）在IMS分离中利用脉冲源以避免在低-该奖项反映了NSF的法定使命，并通过使用基金会的知识价值和更广泛的影响审查标准进行评估，被认为值得支持。

With support from the Chemical Measurement and Imaging Program in the Division of Chemistry, Eric Davis and his group at Whitworth University are working to improve the capabilities of ion mobility spectrometry (IMS), a chemical measurement technique commonly used in security and military applications for the detection of explosives, narcotics, and chemical warfare agents. The Davis group seeks to expand the usefulness of IMS by improving its ability to separate complex, real-world mixtures rapidly. The research is primarily performed by Whitworth undergraduate students under the supervision of Professor Davis. Through collaboration with Brian H. Clowers at Washington State University, Dr. Davis' students are exposed to the graduate school environment, helping to better prepare them to pursue graduate studies. Research opportunities also expand into the local community of analytical chemists within the greater Spokane, WA area, bringing together industrial and academic chemists for the mutual benefit of students and the community.Prior efforts in creating voltage sweep (VS) IMS separations have utilized either stepped-potential or multiplexed VS methods that do not attain the high-resolution or high-speed separations required for many IMS applications. Utilization of printed circuit board-based IMS cells (with minimal circuit tracing to reduce capacitance) and application of high voltage amplifiers (capable of 500 V/ms slew rates) enable single-run VSIMS methods which can provide significant improvements in IMS resolution and peak capacity. Parasitic losses of ions through the gating process under low-field conditions can be mitigated through use of pulsed ionization sources and elimination of the ion gate. Primary aims are to (1) develop a single-run VSIMS method using high voltage amplifiers to allow high resolution, high peak capacity IMS separations; (2) evaluate the utility of pulsed ionization sources with both IMS and mass spectrometry (MS) with respect to ion formation, kinetics, and speciation; and (3) utilize pulsed sources in IMS separations to avoid gate depletion effects under low-field voltage sweep conditions.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.