Advances in Quantification and Resolution in Electron Tomography

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Within the scope of this project we want to understand the resolution limit of our recently suggested Z-contrast method, high angle centred dark-field (HACDF) and evaluate its potential for atomic resolution. Furthermore we want to reveal its capability for electron tomography in a conventional TEM and compare to those of the two other TEM-Z-contrast imaging modes: hollow cone illumination and annular dark-field with circular objective aperture. The aim is to establish a robust and reliable dark-field tomographic method for conventional TEM, aimed for medium resolution material science applications. The HAADF STEM method will be used as a reference. We will also revise and by necessity develop alignment and reconstruction algorithms.