Advances in Quantification and Resolution in Electron Tomography

在这个项目的范围内，我们想要了解我们最近提出的Z-对比度方法--高角中心暗场(HACDF)的分辨率极限，并评估它在原子分辨率方面的潜力。此外，我们还想要揭示其在常规的瞬变电子显微镜中进行电子层析成像的能力，并与另外两种电子显微镜-Z-对比度成像模式进行比较：中空锥体照明和带有圆形物镜孔径的环形暗场。其目的是建立一种适用于中分辨率材料科学应用的常规透射电子显微镜的稳健可靠的暗场层析成像方法。将使用HAADF STEM方法作为参考。我们还将修订和必要地开发比对和重建算法。

Within the scope of this project we want to understand the resolution limit of our recently suggested Z-contrast method, high angle centred dark-field (HACDF) and evaluate its potential for atomic resolution. Furthermore we want to reveal its capability for electron tomography in a conventional TEM and compare to those of the two other TEM-Z-contrast imaging modes: hollow cone illumination and annular dark-field with circular objective aperture. The aim is to establish a robust and reliable dark-field tomographic method for conventional TEM, aimed for medium resolution material science applications. The HAADF STEM method will be used as a reference. We will also revise and by necessity develop alignment and reconstruction algorithms.