Prerequisites and Specifications for Sub Ångström Low-Voltage Transmission Electron Microscopy (SALVE) operation for investigating nano-scale properties of beam-sensitive objects (SALVE III)

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This project SALVE III prepares the prerequisits and specifications for the development and design of a new sub-Ångström low-voltage transmission electron microscope in order to investigate beam sensitive objects that currently cannot be imaged at the atomic level at medium voltages due to radiation damage effects. The project comprises three main fields of investigation:Defining necessary environmental and instrumental conditions for sub-Ångström (high resolution) low-voltage TEM and finding optimum technical solutions. Evaluation of sample preparation methods for a variety of materials in order to satisfy the stringent requirements for samples to be studied at low voltages.Application of the findings of steps 1 and 2 to a variety of materials to explore their properties, which are only accessible by sub-Ångström (high-resolution) low-voltage transmission electron microscopy. Because the full SALVE project is expected to last 5 years, we shall apply for a prolongation of this proposal after three years duration in order to fulfil the application tasks.