Prerequisites and Specifications for Sub Ångström Low-Voltage Transmission Electron Microscopy (SALVE) operation for investigating nano-scale properties of beam-sensitive objects

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This project is dedicated to research on high-resolution low-voltage transmission electron micros-copy and spectroscopy to understand further the interaction of low-energy electrons with matter in order to elucidate the benefits of imaging at low voltages radiation-sensitive objects which cannot be imaged at voltages appreciably higher than about 80 kV. To specify the application of low-voltages, we must find optimum strategies and develop techniques in four main fields: 1. HRTEM imaging of electron-beam-sensitive materials at low voltages: Towards understand-ing radiation damage mechanism at low voltages Application of the concept "sandwich-method" and"carbon nanotube as host" to a variety of beam-sensitive objects and to image and to understand their dynamics at different accelerating voltages. 2. Spectroscopy at low voltages Development of w-q spectroscopy mode for the post-column energy filter and application to experiments on beam-sensitive objects. 3. Image calculations for low voltages Improvement of our calculation algorithm for low-voltage TEM and implementation into standard software for image calculation and analysis, including elastic, inelastic and dose-dependent calculations. Further develop the understanding of contrast with the CC-corrector and defining optimum contrast conditions for low-voltage high-resolution TEM. 4. In-Situ Microscopy and sample preparation at low voltages In-situ measurements on the relationship between defects in a two-dimensional material and its electrical properties in dependence of the accelerating voltage. Methodological developments on preparation and cleanness of low-noise substrates.