Development of High Performance System for the Direct Measurements of Photoelectron Diffraction Patterns

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The purpose of this project is the development of the display system of the photoelectron diffraction image, in order to enable rapid acquisition of two-dimensional photoelectron diffraction patterns. In the first step, basic hardware was assembled by the combination of the retarding field electron energy analyzer, the microchannel plate, the TV camera and the real-time image processor. By using the elastically scattered electron beam, the energy resolution of 1 eV at 900 eV kinetic energy was confirmed.In the second step, as the result of the development of the pulse-counting acquisition mode, which was achieved by differentiation and 1-bit A/D conversion of the video signal, the photoelectron energy spectra excited with the X-ray, which had low flux relative to the electron beam, were obtained. The angular resolution of the analyzer was confirmed to be +/- 0.5゜ from the measurement of low-energy electron diffraction spots.In the final step, investigations were performed of the relationship between X-ray irradiation area and energy resolution, of image accumulation/processing and of the correction method of the image distortion, in order to improve the total throughput of the system. Further project to utilize the synchrotron ratiation has been started, in order to achieve ultimate performance of this system.