Development of Novel Electron Spectrometer for Simultaneous Detection of Energy and Angular Distributions

开发同时检测能量和角分布的新型电子能谱仪

• 批准号: 61850138
• 负责人: NIHEI Yoshimasa
• 金额: $ 16万
• 依托单位: University of Tokyo
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Developmental Scientific Research
• 财政年份: 1986
• 资助国家: 日本
• 起止时间: 1986 至 1988
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-61850138/
• 关键词: Electron Spectrometer; Toroidal Analyzer; Energy Distribution; Angular Distribution; Multichannel Detection; Position Sensitive Detector; X-Ray Photoelectron Spectroscopy; X線光電子回折; X線光電子回析

The aim of this project is to develop a novel charged particle spectrometer which can detect energy and angular distributions simultaneously in order to measure angular distribution of x-ray photoelectrons rapidly and precisely. An electrostatic analyzer with toroidal 180゜ deflection angle is designed and constructed for this purpose. Followings are typical performances of the prototype analyzer.1. Energy Resolution:Energy resolution of the prototype analyzer is estimated by obtaining energy spectra of elastically scattered electrons. Observed full width at half maximum of elastic peak in multichannel-detected energy spectrum is 1.4 eV when the pass-energy of the analyzer is 200 eV. Considering that the width of elastically scattered electrons is finite, true resolution of the prototype analyzer is estimated to be greater than 200.2. Angular Resolution:Polar angle resolution is estimated by measuring LEED spots from molybdenum disulfide surface. Observed width of specular beam is 2゜. Considering that the width of LEED spot is finite, true polar angle resolution is estimated to be less than 1゜. Azimuthal angle resolution of the prototype spectrometer is estimated from geometric parameters of the entrance slit. Geometry defines that azimuthal angle resolution is less than 3゜.

本项目的目的是研制一种能同时探测能量和角分布的新型带电粒子谱仪，以快速、精确地测量X射线光电子的角分布。为此设计并制造了一台偏转角为180 °的环形静电分析器。以下是原型分析仪的典型性能。能量分辨率：通过获得弹性散射电子的能谱来估计原型分析仪的能量分辨率。当分析器的通过能量为200 eV时，在多通道检测的能谱中观察到的弹性峰的半高宽为1.4 eV。考虑到弹性散射电子的宽度是有限的，原型分析器的真实分辨率估计大于200.2。角分辨率：通过测量二硫化钼表面的LEED斑点来估计极角分辨率。观察到的镜面反射光束的宽度为2 μ m。考虑到LEED光斑的宽度有限，估计真极角分辨率小于1 μ m。由入射狭缝的几何参数估计了原型光谱仪的方位角分辨率。几何定义方位角分辨率小于3。