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Development of Novel Electron Spectrometer for Simultaneous Detection of Energy and Angular Distributions

Development of Novel Electron Spectrometer for Simultaneous Detection of Energy and Angular Distributions
开发同时检测能量和角分布的新型电子能谱仪
批准号:
61850138
负责人:
NIHEI Yoshimasa
金额:
$16.0万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Developmental Scientific Research
财政年份:
1986
资助国家:
日本
项目状态:
已结题
起止时间:
1986 至 1988

项目摘要

项目成果

NIHEI Yoshimasa的其他基金

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中文摘要
翻译
这个项目的目标是开发一种新颖的电荷粒子光谱仪,它可以在秩序中检测能量和角度分布,以快速和准确地测量X射线光电子的角度分布。一个带有toroidal 180 ° deflection angle的电静态分析仪是为这一目的设计和构造的。后续信息是原型分析器的典型性能。能源解决方案:原型分析仪的能源解决方案是根据利用弹性散射电子的能量规格估计的。在多通道检测到的能量谱中,观察到的弹性峰值的一半最大宽度为1.4 eV,当分析仪的通过能为200 eV。考虑到弹性散射电子的宽度是有限的,原型分析器的真实分辨率估计大于200.2。角度分辨率:通过测量LEED斑点从molybdenum disulfide表面估计的极角分辨率。观察到的特定光束宽度为2 °。考虑到LEED斑点的宽度是有限的,真正的极角分辨率估计小于1 °。原型光谱仪的Azimuthal angle分辨率被估计为从入口slit的几何参数。几何学定义的azimuthal angle分辨率小于3 °。
英文摘要
The aim of this project is to develop a novel charged particle spectrometer which can detect energy and angular distributions simultaneously in order to measure angular distribution of x-ray photoelectrons rapidly and precisely. An electrostatic analyzer with toroidal 180゜ deflection angle is designed and constructed for this purpose. Followings are typical performances of the prototype analyzer.1. Energy Resolution:Energy resolution of the prototype analyzer is estimated by obtaining energy spectra of elastically scattered electrons. Observed full width at half maximum of elastic peak in multichannel-detected energy spectrum is 1.4 eV when the pass-energy of the analyzer is 200 eV. Considering that the width of elastically scattered electrons is finite, true resolution of the prototype analyzer is estimated to be greater than 200.2. Angular Resolution:Polar angle resolution is estimated by measuring LEED spots from molybdenum disulfide surface. Observed width of specular beam is 2゜. Considering that the width of LEED spot is finite, true polar angle resolution is estimated to be less than 1゜. Azimuthal angle resolution of the prototype spectrometer is estimated from geometric parameters of the entrance slit. Geometry defines that azimuthal angle resolution is less than 3゜.
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Development of nano-scale three-dimensional analytical apparatus for industrial material using an ultra fine focused ion beam
  • 批准号:
    11555226
  • 项目类别:
    Grant-in-Aid for Scientific Research (B).
  • 资助金额:
    $8.83万
  • 财政年份:
    1999
  • 负责人:
    NIHEI Yoshimasa
  • 依托单位:
Real tine characterization and control of growing interface structures of thin films
  • 批准号:
    10450317
  • 项目类别:
    Grant-in-Aid for Scientific Research (B)
  • 资助金额:
    $7.81万
  • 财政年份:
    1998
  • 负责人:
    NIHEI Yoshimasa
  • 依托单位:
Comprehensive Research on Next Generation of Analytical Methodology for Environmental Protection
  • 批准号:
    08308034
  • 项目类别:
    Grant-in-Aid for Scientific Research (A)
  • 资助金额:
    $9.47万
  • 财政年份:
    1996
  • 负责人:
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  • 依托单位:
Development of Three-Dimensional Microanalysis usig Ion and Electron Dual Focused Beams
  • 批准号:
    06555254
  • 项目类别:
    Grant-in-Aid for Scientific Research (A)
  • 资助金额:
    $1.34万
  • 财政年份:
    1994
  • 负责人:
    NIHEI Yoshimasa
  • 依托单位: