权益分类	功能权益	普通用户	{{item.name}}会员
{{category.name}}	{{benefitItem.name}}

Design of a low background mass spectromenter for a high sensitive analytical ion microscope

高灵敏度分析离子显微镜低背景质谱仪的设计

基本信息

批准号：
60840024
负责人：
NISHIMURA Hiroshi
金额：
$ 7.1万
依托单位：
Naruto University of Education (1986-1987)Osaka University (1985)
依托单位国家：
日本
项目类别：
Grant-in-Aid for Developmental Scientific Research
财政年份：
1985
资助国家：
日本
起止时间：
1985 至 1987
项目状态：
已结题

来源：
https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-60840024/
关键词：
mass spectrometer ion microscope isotope analysis 同位体比 IMA SIMS 同位体異常

项目摘要

The design of a double fousing mass spcectrometer has been attempted as a part of a highly sensitive analytical ion microscope for the isotope analysis of solid samplesd. It has the follwoing capabilities; (1) high mass resolbing power of about 3200, (2) high sensitivity with a wide dynamic range of 5 orders of magnitude and (3) high accuracy of measurement of about (+-)0.5%. We calcuated the ion optical parameters of the mass spectrometer using "the program for a personal computer" by Matsuda (1983) in the journal of Mass Spectroscopy. The results of the calculation is as follows; electric field: 75゜ in deflection angle and 40cm in rafidus, magnetic field: 90゜ in deflection angle and 20cm in radius and mass resolving power: 3400 2( 100um width of a collector slit. Based on this design, An analyzer chamber, an electro-matnet, a momwntum analyzer and its chamber wete constructed. A controlling circuit for evacuation system has been designed and consttucted, this can be connected to a personal computer through an interface and relays.These were tested for vaclum and the ultimate pressure of the system ha benn attained to be about 1 X 10^<-7> Torr without any baking of the chambe. As for an electro-magnet, magnetic field at the cenger of of pole pieces was found to be able to sweep over the trange 0-5000 Gauss. This range corresponds to the mass range of 0-250 at an ion accelecrating voltage of 2kV.Therfore, this double focusing mass spectrometer can be used as a detector of a highly sensitive analytical ion microscope.

本文介绍了一种用于固体样品同位素分析的高灵敏度分析离子显微镜的双聚焦质谱计的设计。它具有以下性能：（1）高质量分辨力（3200左右），（2）高灵敏度（5个数量级）和宽动态范围（± 0.5%）。我们用Matsuda（1983）在《质谱学杂志》上发表的“个人计算机程序”计算了质谱仪的离子光学参数。计算结果为：电场：偏转角75 μ m，半径40 cm，磁场：偏转角90 μ m，半径20 cm，质量分辨力：3400 2（收集极狭缝宽度100 μ m）。在此设计基础上，构建了分析仪室、电磁网、动量分析仪及其室。设计并制作了一套抽真空系统的控制电路，该电路通过接口和继电器与微机相连，经真空试验，在不烘烤的情况下，系统的极限压力可达1 × 10 ~ 4<-7>托。对于电磁铁，极靴中心的磁场可以扫过0-5000高斯的范围。在离子加速电压为2kV时，此范围对应于0-250的质量范围。因此，此双聚焦质谱计可用作高灵敏度分析离子显微镜的检测器。