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Emission Spectrometry for Inorganic Material Surface

Emission Spectrometry for Inorganic Material Surface
无机材料表面发射光谱分析
批准号:
61850137
负责人:
MATSUI Tomoko
金额:
$2.62万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Developmental Scientific Research
财政年份:
1986
资助国家:
日本
项目状态:
已结题
起止时间:
1986 至 1987

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中文摘要
翻译
该红外发射光谱被样品表面温度的变化所证明。表面样品的温度由60 °、40 °、20 °和10 ° C的渗透效应控制。本温度控制系统是由热模块组装的(Melcor Japan Co. Ltd)与214 PID直接-当前电源供应( (SHINNIPPON DENKO Co. LTD.,),在TTS-15 FTIR(Digilab)的外部样本位置上设置。热模块的背面要么是水,要么是冰水冷却的。在铝油或高温度下,样品是二硫基phthalate和聚甲基methacrylate(PMMA)。发射带的强度更大,是制造出来的。60 ° C的波段强度比40 ° C的光谱更强。当温度低于光束splitter的时候,例如20 ° C,乐队的方向转向了,更远,强度在10 ° C增加了。The spectra of low temperature were coused by the rfeflection of beam splitter radiation from metal substrate of sample system。因此,这个特殊的轨道被传送到表面层的两次。因此,更敏感的发射剂可能会被校正到反射剂的情况下,当这种剂的温度比光束splitter高得多。陶瓷上的PMMA(热模块表面)的特殊特性是可测量的。在60 ° C和10 ° C时,陶瓷的发射光谱被讨论,该光谱显示在1000厘米-1区域的宽带上。1725厘米的PMMA波段是干净的,但1150厘米的发射波段是几乎直接与陶瓷波段一起消失的。在相反的情况下,1725厘米的波段位于相反方向,1150厘米在10 ° C的发射波段被探测到。在结果中,陶瓷上的有机层的一种特殊的有机层是可能的,通过相互纠正,对两个更高和更低的样品的温度比光束splitter。
英文摘要
The infrared emission spectra were discussed with the change of sample surface temperature. The temperature of surface sample was respectivelyh controlled by using Pelitier Effect for 60゜, 40゜, 20゜, and 10゜C. This temperature control system was assembled by the thermo-moduale (Melcor Japan Co.LTD.) equipped with 214 PID direct- current power supply ( (SHIN NIPPON DENKO Co.LTD.,), setted on the out side sample position of TTS-15 FTIR(Digilab). The back side of the thermo-module was cooled by water or ice water. The samples were diocthylphthalate and polymethylmethacryrate (PMMA) on Alminum foil or tharmo-module The higher temperature. the stronger intensity of emission band was made. The band intensity of 60゜C Is for times as stronger as the spectrum of 40゜C. When the temparature was lower than that of beam-splitter, for example 20゜C, the direction of the bands were turned, furthermore,the intensities were increased at the 10゜C. The spectra of low temperature were coused by the rfeflection of beam splitter radiation from metal substrate of sample system. Therefore the spectra were coresponded to two times transmission of surface layer. So, more sensitive emission spectra may be obtained by correcting of the reflection component when the spectra are measured by more higher temperature than the beam splitter. The spectra of PMMA on ceramic (the surface of thermo-module) were measured . at 60゜ and 10゜C , the spectra were discussed with the transmission spectrum of ceramic that shown the broad band at the 1000 cm-1 region. The band of 1725 cm of PMMA was made clear but 1150 cm emission band that is almost directry together with the ceramic band was disappeared. On the-contrary, the 1725 cm band was in opposite direction, and 1150 cm was detected as emission band at 10゜C. In the results, spectra of organic layer on ceramic is possible to obtain by mutural correction with both higher and lower sample temperature than beam splitter.
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