Emission Spectrometry for Inorganic Material Surface

无机材料表面发射光谱分析

• 批准号: 61850137
• 负责人: MATSUI Tomoko
• 金额: $ 2.62万
• 依托单位: Tokyo Univ. Faculty of Engineering
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Developmental Scientific Research
• 财政年份: 1986
• 资助国家: 日本
• 起止时间: 1986 至 1987
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-61850137/
• 关键词: Surface; FTIR; Emission; Composite-Material; 発光分光

The infrared emission spectra were discussed with the change of sample surface temperature. The temperature of surface sample was respectivelyh controlled by using Pelitier Effect for 60゜, 40゜, 20゜, and 10゜C. This temperature control system was assembled by the thermo-moduale (Melcor Japan Co.LTD.) equipped with 214 PID direct- current power supply ( (SHIN NIPPON DENKO Co.LTD.,), setted on the out side sample position of TTS-15 FTIR(Digilab). The back side of the thermo-module was cooled by water or ice water. The samples were diocthylphthalate and polymethylmethacryrate (PMMA) on Alminum foil or tharmo-module The higher temperature. the stronger intensity of emission band was made. The band intensity of 60゜C Is for times as stronger as the spectrum of 40゜C. When the temparature was lower than that of beam-splitter, for example 20゜C, the direction of the bands were turned, furthermore,the intensities were increased at the 10゜C. The spectra of low temperature were coused by the rfeflection of beam splitter radiation from metal substrate of sample system. Therefore the spectra were coresponded to two times transmission of surface layer. So, more sensitive emission spectra may be obtained by correcting of the reflection component when the spectra are measured by more higher temperature than the beam splitter. The spectra of PMMA on ceramic (the surface of thermo-module) were measured . at 60゜ and 10゜C , the spectra were discussed with the transmission spectrum of ceramic that shown the broad band at the 1000 cm-1 region. The band of 1725 cm of PMMA was made clear but 1150 cm emission band that is almost directry together with the ceramic band was disappeared. On the-contrary, the 1725 cm band was in opposite direction, and 1150 cm was detected as emission band at 10゜C. In the results, spectra of organic layer on ceramic is possible to obtain by mutural correction with both higher and lower sample temperature than beam splitter.

讨论了样品表面温度的变化对红外发射光谱的影响。利用Pelitier效应分别对60゜、40゜、20゜和10゜C的表面样品进行温度控制。配备214 PID直流电源(Shin Nippon Denko Co.Ltd.)，设置在TTS-15 FTIR(Digilab)的外侧采样位置。热模块的背面用水或冰水冷却。样品为邻苯二甲酸二辛酯和聚甲基丙烯酸甲酯(PMMA)。发射带强度越强。60゜C的谱线强度是40゜C谱线的数倍，当温度低于分束器的温度时，例如20゜C，谱线方向发生了变化，并且在10゜C时强度增大。因此，光谱对表层的两次透射率有共同的响应。因此，当用比分束器更高的温度测量光谱时，可以通过对反射分量的修正来获得更灵敏的发射光谱。测量了PMMA在陶瓷(热模块表面)上的光谱。在60゜和10゜C温度下，与陶瓷的透射谱进行了讨论，在1000 cm-1处出现了宽带。PMMA的1725 cm发射带清晰可见，但与陶瓷带几乎直接相连的1150 cm发射带消失。相反，在10゜C时，1725 cm谱带和1150 cm谱带是相反的。结果表明，在样品温度高于或低于分束器温度的情况下，通过相互校正都可以获得陶瓷表面有机层的光谱。