A3: Metrology of High-bandwidth Sampling Systems

A3：高带宽采样系统的计量

• 批准号: 424607946
• 负责人: Professor Dr. Thomas Schneider
• 金额: --
• 依托单位: Institut für Hochfrequenztechnik
• 依托单位国家: 德国
• 项目类别: Research Units
• 资助国家: 德国
• 项目状态: 未结题
• 来源: https://gepris.dfg.de/gepris/projekt/424607946?language=en
• 关键词: A3; Metrology; bandwidth; Sampling; Systems

In the first phase of METERACOM we have successfully investigated the metrology of high-bandwidth sampling systems and of integrated devices for sampling. But, we have restricted ourselves to a baseband width of around 40 GHz. However, exponentially increasing data rates, especially in wireless systems, have led to the definition of peak data rates of 1 Tbps for next generation systems like 6G and beyond. Such high data rates not only need new carrier frequencies in the THz region of the spectrum. In order to relax the requirements on the spectral efficiencies of the electronic signal processing, they need higher baseband widths, too. Thus, in the second phase of METERACOM, we will investigate error sources of several methods for increasing the processible bandwidth of sampling systems by a parallelization of the incoming high-bandwidth signal into several low-bandwidth sub-signals in the time or frequency domain. These sub-signals can then be detected and further processed in parallel by low-bandwidth electronics. In this sub-project of METERACOM we will investigate the error sources of these parallelization systems, possibilities to mitigate them and (in strong collaboration with A1 and T) we will establish a traceable measurement chain to the representation of SI units for the assessment and mutual comparison of these systems. Additionally, in collaboration with B2 and C3, we will make experiments and develop simulation models for the practical investigation of one of the parallelization systems we have invented in the first phase of the project, which enables a separation into the sub-channels with very low error. Furthermore, we will develop algorithms for the simulation of sampling systems with best in class components, currently available in research for the evaluation of the experiments in B2 and the model of C3. We will mainly build on initial preliminary results achieved in the first phase of the project and by a collaboration with the University of Rennes we will have access to a laser system which makes the state of the art in spectral purity.

在METERACOM的第一阶段，我们成功地研究了高带宽采样系统和集成采样设备的计量。但是，我们将自己的基带宽度限制在40 GHz左右。然而，指数级增长的数据速率，特别是在无线系统中，导致下一代系统(如6G及更高版本)的峰值数据速率定义为1 Tbps。如此高的数据速率不仅需要在频谱的太赫兹区域中有新的载波频率。为了放宽对电子信号处理的频谱效率的要求，他们还需要更高的基带带宽。因此，在METERACOM的第二阶段，我们将调查几种增加采样系统可处理带宽的方法的误差源，这些方法是通过将输入的高带宽信号在时间或频率域中并行化成几个低带宽子信号来增加的。然后，这些子信号可以被低带宽电子设备并行检测和进一步处理。在METERACOM的这个子项目中，我们将调查这些并行化系统的误差源，减轻它们的可能性，并(与A1和T密切合作)我们将建立一个可追溯的测量链，以表示SI单位，用于评估和相互比较这些系统。此外，我们将与B2和C3合作，为项目第一阶段发明的一个并行化系统的实际研究进行实验和开发仿真模型，该系统能够以非常低的误差分离到子通道。此外，我们将开发具有最好组件的采样系统的仿真算法，目前可用于评估B2中的实验和C3模型的研究。我们将主要建立在项目第一阶段取得的初步成果的基础上，通过与雷恩大学的合作，我们将获得一种使光谱纯度达到最先进水平的激光系统。