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ラザフォード散乱同時計測法による荷電粒子励起X線放出分析の高感度化

使用同时卢瑟福散射测量方法提高带电粒子激发 X 射线发射分析的灵敏度

基本信息

批准号：
13875018
负责人：
小栗慶之
金额：
$ 1.34万
依托单位：
Tokyo Institute of Technology
依托单位国家：
日本
项目类别：
Grant-in-Aid for Exploratory Research
财政年份：
2001
资助国家：
日本
起止时间：
2001 至 2002
项目状态：
已结题

项目摘要

昨年度には,ラザフォード後方散乱(RBS)との同時計数を増加させるため,測定立体角が大きいアニュラ型のSi表面障壁型半導体荷電粒子検出器(SSD)を用意し,これを真空容器のビーム入射側(後方)に設置した.しかし,荷電粒子励起X線放出(PIXE)のスペクトル上で入射ビームがこのSSDに衝突することによるバックグラウンドが増大した.このためやむをえず今年度は従来通り通常型のSSDを用いて測定を行った.ただし,今回はPIXEとの同時計数率を向上させるために散乱断面積の大きい前方の45°にSSDを設置した.試験用のターゲットとして,ポリカーボネート薄膜上に原子吸光分析用の標準溶液を滴下,乾燥したものを用いた.PIXE, RBSの時間信号をそれぞれTiming Filter Amplifierにより増幅した後,Constant Fraction Discriminatorに通して波形整形を行い,Time to Amplitude ConverterにStart, Stop信号として入力し,時間差に比例する波高信号を発生させた.この信号を波高分析器に与えて波高分布を調べたが,時間スペクトル上に特定のピークが見えず,したがってPIXEとRBSの信号間に有意な時間的相関を見出すことができなかった.適当な時間領域でPIXE測定用マルチチャンネルアナライザーにゲートをかけたが,X線スペクトル上で二次電子の制動放射による連続バックグラウンドを低減させることはできなかった.比較的薄い試料としてフィルターに付着した土壌や浮遊粒子状物質等の環境試料,及び燃料電池電極触媒薄膜中の微量元素測定も行ったが検出感度を向上することはできなかった.これらの結果により,入射陽子の散乱角と内殻電離確率との定量的関係について再検討する必要があることが分った.

Last year, the rear scatter (RBS) was used to measure the surface barrier half-body particle ejector (SSD) of the Si with large angle, and the vacuum container was used to set the incident device (rear). The charged particles are excited by the X-ray emission (PIXE). The incident signal is the incident beam. The SSD signal is abruptly impacted. Please tell me that this year you are going to use the normal SSD to determine the performance of the system. This time, the PIXE counter rate is significantly higher than that of the scattered cross-section at the front of the 45 °SSD setting. After using the standard solution for atomic absorption analysis on the thin film, drop the standard solution for the atomic absorption analysis on the thin film, drop the standard solution for the atomic absorption analysis on the thin film, use the standard solution for the atomic absorption analysis on the thin film, drop the standard solution for the atomic absorption analysis on the thin film, use the standard solution for the atomic absorption analysis on the thin film, use the standard solution for the atomic absorption analysis on the thin film, use the standard solution for the atomic absorption analysis on the thin film, use the standard solution for the atomic absorption analysis on the thin film, use the standard solution for the atomic absorption analysis on the thin film, use the standard solution for the atomic absorption analysis on the thin film, use the standard solution for the atomic absorption analysis on the thin film, use the standard solution for the atomic absorption analysis on the thin film, use the standard solution for the atomic absorption analysis on the thin film, use the standard solution for the atomic absorption analysis on the thin film, drop the standard solution for the atomic absorption analysis on the thin film, use the standard solution for the atomic absorption The signal height analyzer and the signal height distribution are sensitive, and the time is sensitive to the response of the specific signal, and the correlation between the PIXE signal and the RBS signal is not available in the intended time. When the PIXE measurement in the field of time is used in the field of wireless communication, it is necessary to use the system in the field of wireless communication. When the system is used in the field of PIXE, it is necessary to use the system in the field of wireless communication. The thin materials are used for the determination of trace elements in the thin film of fuel cells, such as environmental materials, such as soil, float, particles, etc., and the determination of trace elements in the cathode catalyst film of fuel cell. The results show that the incident signal is located in the scattered angle of the incident signal, and the accuracy rate of the incident signal is very high.