Ultra-Fine Surface Analysis by a Combined Instrument of an STM and A-P

STM 和 A-P 组合仪器进行超精细表面分析

基本信息

  • 批准号:
    01460211
  • 负责人:
  • 金额:
    $ 4.61万
  • 依托单位:
  • 依托单位国家:
    日本
  • 项目类别:
    Grant-in-Aid for General Scientific Research (B)
  • 财政年份:
    1989
  • 资助国家:
    日本
  • 起止时间:
    1989 至 1990
  • 项目状态:
    已结题

项目摘要

The surface study utilizing the unique capability of a scanning tunneling microscope (STM) with atomically high resolution has made us realize that the tunneling characteristics of the STM strongly depend on the structure and composition of the apex of a scanning tip and that the promotion of the surface study with the STM requires the clarification of the tip profile. Then we have realized that an atom-probe (A-P) would be the most suitable instrument for clarifying the apex profile because it can directly image the atomic arrangement and mass analyze individual apex atoms. Accordingly, the outcomes of this research are :(1) Development of a combined instrument of an ultra-high vacuum STM and an A-P.(2) Development of scanning tunneling spectroscopy (STS) to investigate the electronic states of individual surface atoms of surfaces.(3) Installation of a field emission electron spectrometer (FEES) to energy analyze the field emitted electrons from the tip apex. The FEES study successfully demonstrated the variation of the electronic states of metal tip apexes by hydrogen adsorption and a Si cluster of a few atoms.(4) Systematic analysis of the correlation between STM images, STS spectra and the profile of tip apexes. The study clarified that plural apex atoms participating in the electron tunneling generates anomalous ordered STM images and STS spectra varies with the cone angle of the tip apex.The present study suggests that the clarification of the apex profiles is the fundamental requirement for obtaining the reproducible, reliable data with STM and STS. The study is extending over various materials from metals, semiconductors, ceramics to conductive polymers.
利用具有原子高分辨率的扫描隧道显微镜(STM)的独特能力进行表面研究,使我们认识到STM的隧道特性强烈地依赖于扫描尖端的结构和成分,而用STM促进表面研究需要澄清尖端的轮廓。然后,我们意识到原子探针(A-P)将是最适合于澄清峰形的工具,因为它可以直接成像原子排列并对单个峰原子进行质量分析。因此,这项研究的成果如下:(1)开发了超高真空STM和A-P联合仪器。(2)开发了扫描隧道光谱(STS),以研究表面单个表面原子的电子态。(3)安装场发射电子能谱仪(FECH),以分析从尖端发出的电子的场。LEFES研究成功地证明了氢吸附和少量原子组成的硅团簇改变了金属尖端的电子态。(4)系统地分析了STM图像、STS光谱和尖端轮廓之间的相关性。研究表明,参与电子隧穿的多个顶端原子产生反常有序的STM图像,并且STS谱随尖端锥角的变化而变化。研究表明,澄清顶端轮廓是获得STM和STS可重复性、可靠性数据的基本要求。这项研究涉及从金属、半导体、陶瓷到导电聚合物的各种材料。

项目成果

期刊论文数量(54)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
O. Nishikawa, H. Koyama, N. Kodama and M. Tomitori: "The Atom-Probe with a Field Emission Electron Spectrometer" Colloque de Physique. Vol. 50,. C8-507 (1989)
O. Nishikawa、H. Koyama、N. Kodama 和 M. Tomitori:“带有场发射电子能谱仪的原子探针”Colloque de Physique。
  • DOI:
  • 发表时间:
  • 期刊:
  • 影响因子:
    0
  • 作者:
  • 通讯作者:
F.Iwawaki,M.Tomitori and O.Nishikawa: "STM/STS Observation of Step Structres of Si(001) and (111) Surfaces" J.Vac.Sci.Technol.A.
F.Iwawaki、M.Tomitori 和 O.Nishikawa:“Si(001) 和 (111) 表面阶梯结构的 STM/STS 观察”J.Vac.Sci.Technol.A。
  • DOI:
  • 发表时间:
  • 期刊:
  • 影响因子:
    0
  • 作者:
  • 通讯作者:
M.Tomitori,F.Iwawaki,N.Hirono,F.Katsuki and O.Nishikawa: "Corrugation of Si Surfaces and Profiles of Tip Apexes" J.Vacuum Science and Technology. A8. 222-225 (1990)
M.Tomitori、F.Iwawaki、N.Hirono、F.Katsuki 和 O.Nishikawa:“Si 表面的波纹和尖端顶点的轮廓”J.真空科学与技术。
  • DOI:
  • 发表时间:
  • 期刊:
  • 影响因子:
    0
  • 作者:
  • 通讯作者:
O. Tomitori, F. Iwawaki, N. Hirano, F. Katsuki and o Nishikawa :"Corrugation of Si Surfaces and Profiles of Tip Apexes" J. Vac. Sci. Technol. A. Vol. 8,. 222 (1990)
O. Tomitori、F. Iwawaki、N. Hirano、F. Katsuki 和 o Nishikawa:“Si 表面的波纹和尖端顶点的轮廓” J. Vac。
  • DOI:
  • 发表时间:
  • 期刊:
  • 影响因子:
    0
  • 作者:
  • 通讯作者:
O. Nishikawa, M. Tomitori and F. Iwawaki :"Atomic Con-figurations of Tip Apexes and Scanning Tunneling Microscopy/Spectroscopy" Materials Sci. Engineering. (1991)
O. Nishikawa、M. Tomitori 和 F. Iwawaki:“尖端顶点的原子构型和扫描隧道显微镜/光谱学”材料科学。
  • DOI:
  • 发表时间:
  • 期刊:
  • 影响因子:
    0
  • 作者:
  • 通讯作者:
{{ item.title }}
{{ item.translation_title }}
  • DOI:
    {{ item.doi }}
  • 发表时间:
    {{ item.publish_year }}
  • 期刊:
  • 影响因子:
    {{ item.factor }}
  • 作者:
    {{ item.authors }}
  • 通讯作者:
    {{ item.author }}

数据更新时间:{{ journalArticles.updateTime }}

{{ item.title }}
  • 作者:
    {{ item.author }}

数据更新时间:{{ monograph.updateTime }}

{{ item.title }}
  • 作者:
    {{ item.author }}

数据更新时间:{{ sciAawards.updateTime }}

{{ item.title }}
  • 作者:
    {{ item.author }}

数据更新时间:{{ conferencePapers.updateTime }}

{{ item.title }}
  • 作者:
    {{ item.author }}

数据更新时间:{{ patent.updateTime }}

NISHIKAWA Osamu其他文献

NISHIKAWA Osamu的其他文献

{{ item.title }}
{{ item.translation_title }}
  • DOI:
    {{ item.doi }}
  • 发表时间:
    {{ item.publish_year }}
  • 期刊:
  • 影响因子:
    {{ item.factor }}
  • 作者:
    {{ item.authors }}
  • 通讯作者:
    {{ item.author }}

{{ truncateString('NISHIKAWA Osamu', 18)}}的其他基金

Investigation of stress field and pulverization mechanism at the fault rapture front propagating at a high speed
高速传播断层破裂前缘应力场及粉碎机制研究
  • 批准号:
    23654170
  • 财政年份:
    2011
  • 资助金额:
    $ 4.61万
  • 项目类别:
    Grant-in-Aid for Challenging Exploratory Research
Evaluation of the residual stress on the fault plane by stick slip experiment and high resolution observation of slip plane
粘滑实验及滑移面高分辨率观测评价断层面残余应力
  • 批准号:
    20540442
  • 财政年份:
    2008
  • 资助金额:
    $ 4.61万
  • 项目类别:
    Grant-in-Aid for Scientific Research (C)
Atomic Level Study of Photo-Stimulated Field Emission from Insulating Thin Layers Utilizing the Scanning Atom Probe
利用扫描原子探针进行绝缘薄层光激场发射的原子水平研究
  • 批准号:
    09450023
  • 财政年份:
    1997
  • 资助金额:
    $ 4.61万
  • 项目类别:
    Grant-in-Aid for Scientific Research (B)
TUNNELING CHARACTERISCITCS OF INDIVIDUAL SURFACE ATOMS
单个表面原子的隧道特性
  • 批准号:
    05245106
  • 财政年份:
    1997
  • 资助金额:
    $ 4.61万
  • 项目类别:
    Grant-in-Aid for Scientific Research on Priority Areas
Study on the Advancement of the Geographic Information Science (GIS) and the Organization for the GIS Education and Research
地理信息科学的发展及GIS教育与研究的组织研究
  • 批准号:
    06306012
  • 财政年份:
    1994
  • 资助金额:
    $ 4.61万
  • 项目类别:
    Grant-in-Aid for Scientific Research (A)
ATOM MAMIPULATION AND EVALUATION OF PROBING TIPS
原子操纵和探测尖端的评估
  • 批准号:
    05245107
  • 财政年份:
    1993
  • 资助金额:
    $ 4.61万
  • 项目类别:
    Grant-in-Aid for Scientific Research on Priority Areas
Development of Field Emission Type Ultra-High Vacuum Gauge
场发射型超高真空计的研制
  • 批准号:
    02555009
  • 财政年份:
    1990
  • 资助金额:
    $ 4.61万
  • 项目类别:
    Grant-in-Aid for Developmental Scientific Research (B)
Ultramicroanalysis of Conducting Polymers with Atom-Probe
用原子探针对导电聚合物进行超微量分析
  • 批准号:
    61460062
  • 财政年份:
    1986
  • 资助金额:
    $ 4.61万
  • 项目类别:
    Grant-in-Aid for General Scientific Research (B)
Ultra-Microscopic Analysis of Metal-Compound Semiconductor Interfaces by the Atom-Probe Mass Analyzer
利用原子探针质量分析仪对金属化合物半导体界面进行超显微分析
  • 批准号:
    59420038
  • 财政年份:
    1984
  • 资助金额:
    $ 4.61万
  • 项目类别:
    Grant-in-Aid for General Scientific Research (A)
{{ showInfoDetail.title }}

作者:{{ showInfoDetail.author }}

知道了