Measurement of Inter-materials forces by Atomic Force Microscopy (AFM) .

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The adhesional contact between two solids is significant in the fields of tribology and the joining technology. It is also important for the design of surface force apparatuses such as atomic force microscopy (AMF) .In the present study, we propose the modified MYD theory taking account of the stiffness of the measurement system such as the cantilever of atomic force microscopy (AMF) .The total energy is assumed to beE_total=E_elastic+E_interface+E_surface+E_stiffness.where $E_{\rm elastic} $ is the elastic energy of contacting sphere (pin) , $E_{\rm interface} $ is the term for the energy change from surface to interface within the contact region, E_surface is the potential energy between surfaces outside of the contact region and E_stiffness is the contribution by the stiffness of the measurement system.Our approach conforms to the original one in the limit when the stiffness becomes infinite and conforms to the authors prior theory in the limit when the interaction between surfaces are negligible. Furthermore, the present approach conforms to the JKR theory in the limit when the stiffness becomes infinite and the interaction between surfaces are negligible.In the present study, we introduce the AFM to ultra high vacuum chamber which has ion supttering system. After the ion sputtering, the intermaterial forces are measured. The results are discussed with above thory. Not only intermaterial electronic interation, but also the surface roughness and the stiffness of the measurement system affact on the results. In order to understand the adhesion more in terms of material science, the more well defined condition is essential.